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Investigation of Hydrogen Storage Using Combinatorial Thin Films and IR Imaging

Published online by Cambridge University Press:  01 February 2011

Hiroyuki Oguchi ,
Ichiro Takeuchi ,
Daniel Josell ,
Edwin J Heilweil  and
Leonid A Bendersky
Hiroyuki Oguchi
Affiliation:
[email protected], University of Maryland, Department of Materials Science and Engineering, University of Maryalnd, College Park, MD, 20742, United States
Ichiro Takeuchi
Affiliation:
[email protected], University of Maryland, College Park, MD, 20742, United States
Daniel Josell
Affiliation:
[email protected], National Institute of Standards and Technology, Gaithersburg, MD, 20899, United States
Edwin J Heilweil
Affiliation:
[email protected], National Institute of Standards and Technology, Gaithersburg, MD, 20899, United States
Leonid A Bendersky
Affiliation:
[email protected], National Institute of Standards and Technology, Gaithersburg, MD, 20899, United States
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Abstract

Three 100 nm-thick Mgx(TM)1-x (TM = Ni and Ti) composition spread thin films having compositional variation 0.4<x<0.95 and capped with a 5 nm-thick Pd layer were deposited in combinatorial electron-beam (e-beam) deposition chamber. Crystallinity of the films was characterized by scanning x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). Hydrogen absorption and desorption of the films were monitored with an infrared (IR) camera that could image a full area of the films. The observed changes in IR intensity due to hydrogen absorption/desorption demonstrated sensitivity of the method to the differences in compostion, microstructure and type of TM.

Keywords

hydrogenationcombinatorial synthesisthin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1042: Symposium S – Materials and Technology for Hydrogen Storage , 2007 , 1042-S01-11
Copyright
Copyright © Materials Research Society 2008

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References

1. Borsa, D. M., Lohstroh, W., Gremaud, R., Rector, J. H., Dam, B., Wijngaarden, R. J., and Grissen, R., J. Alloys Comp. 428, 34 (2007).Google Scholar
2. Eastman, J. A., Thompson, L. J., and Kestel, B. J., Phys. Rev. B 48, 84 (1993). L. Pranevicius, D. Milcius, L. L. Pranevicius, C. Templier, B. Bobrovaite, and I. Barnackas, Appl. Surf. Sci. 252, 4202 (2006).Google Scholar
3. Schlapbach, L., Zuttel, A., Nature 414, 353 (2001).10.1038/35104634Google Scholar
4. Zaluski, L., Zaluska, A., Tessier, P., Stromolsen, J. O., and Schulz, R., J. Alloys Comp. 217, 295 (1995).Google Scholar
5. Lohstroh, W., Westerwaal, R. J., Mechelen, J. L. van, Chacon, C., Johansson, E., Dam, B., and Griessen, R., Phys. Rev. B 70, 165411 (2004).Google Scholar
6. Borsa, D. M., Gremaud, R., Baldi, A., Schreuders, H., Rector, J. H., Kooi, B., Vermeulen, P., Notten, P. H. L., Phys. Rev. B 75, 205408 (2007).Google Scholar
7. Olk, C. H., Tibbetts, G. G., Simon, D., and Moleski, J. J., J. Appl. Phys. 94, 720 (2003).Google Scholar