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Investigation of Deep Level Defects in Mercuric Iodide by Thermally Stimulated Current Spectroscopy

Published online by Cambridge University Press:  26 February 2011

X.J. Bao ,
T.E. Schlesinger ,
R.B. James ,
A.Y. Cheng ,
C. Olrtale  and
L. Van Den Berg
X.J. Bao
Affiliation:
Carnegie Mellon University, Department of Electrical and Computer Engineering, Pittsburgh, PA 15213
T.E. Schlesinger
Affiliation:
Carnegie Mellon University, Department of Electrical and Computer Engineering, Pittsburgh, PA 15213
R.B. James
Affiliation:
Sandia National Laboratories, Advanced Materials Division, Livermore, CA 94450
A.Y. Cheng
Affiliation:
EG&G Energy Measurcments, Inc., Goleta, CA 93116
C. Olrtale
Affiliation:
EG&G Energy Measurcments, Inc., Goleta, CA 93116
L. Van Den Berg
Affiliation:
EG&G Energy Measurcments, Inc., Goleta, CA 93116
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Abstract

Mercuric iodide (HgI2) single crystals deposited with semitransparent Pd, Al and Ag contacts were studied by thermally stimulated current spectroscopy (TSC). Distinct differences were found among spectra obtained friom samples withdifferentmetal contacts, indicating that interactions between the metal contacts and mercuric iodide substrates have strong effects on the deep defect levels in mercuric iodide. The activation energies of some of these defect levels were estimated bytaking TSC spectra with different heating rates. In addition, a pyroelectric effect was observed in Ag-contactedsamplesbythermally stimulated depolarization current technique (TSDC). The implications of these results in device applicationsof mercuric iodide are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 541
Copyright
Copyright © Materials Research Society 1991

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References

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