Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-06T05:18:23.094Z Has data issue: false hasContentIssue false

Investigation Of Deep Energy Levels In II-VI Compounds

Published online by Cambridge University Press:  15 February 2011

A. Castaldini
Affiliation:
INFM and Department of Physics, University of Bologna, Bologna, Italy
A. Cavallini
Affiliation:
INFM and Department of Physics, University of Bologna, Bologna, Italy
P. Fernandez
Affiliation:
Departamento de Fisica de Materiales, Facultad de Ciencias Fisicas, Universidad Complutense, 28040 Madrid, Spain
B. Fraboni
Affiliation:
INFM and Department of Physics, University of Bologna, Bologna, Italy
J. Piqueras
Affiliation:
Departamento de Fisica de Materiales, Facultad de Ciencias Fisicas, Universidad Complutense, 28040 Madrid, Spain
Get access

Abstract

Deep levels in II-VI compounds have been investigated to understand their role in the compensation mechanism and their influence on the material electrical and optical properties. The electrical properties have been studied by current and capacitance transient spectroscopy, while the optical properties have been studied by cathodoluminescence. We have focused our attention on the traps involved in the compensation process, such as centre A and the deep levels located near midgap.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Fiederle, M., Ebling, D., Eiche, C., Hofmiann, D. M., Salk, M., Stadler, W., Benz, K. W. and Meyer, B. K., J.Crystal Growth 138, 529 (1994)Google Scholar
[2] Hofmann, D. M., Omling, D., Grimmeiss, H. G., Meyer, B. K., Benz, K. W. and Sinerius, D., Phys.Rev.B 45, 6247 (1992)Google Scholar
[3] Stadler, W., Hoffinan, D. M., Alt, H. C., Muschik, T., Meyer, B. K., Weigel, E., Müller-Vogt, G., Salkv, M., Rupp, E. and Benz, K. W., Phys.Rev.B 51, 10619 (1995)Google Scholar
[4] Blood, P. and Orton, J. W., The Electrical Characterization of Semiconductors: Majority Carriers and Electron States, (Academic Press, U.K., 1992).Google Scholar
[5] Yoshie, O., Kamihara, M., Jpn.J.Appl.Phys. 22 629 (1983).Google Scholar
[6] Mooney, P.M. J.Appl.Phys. 54, 208 (1983).Google Scholar
[7] Davis, C.Barnett, Alred, D. D., Reyes-Mena, A., Gonzalez-Hernandez, J., Gonzales, O., Hess, B. C. and Allred, W. P., Phys.Rev.B 47, 13363 (1993)Google Scholar
[8] Pal, U., Fernandez, P., Piqueras, J., Sochinskii, N. V. and Dieguez, E., J.Appl.Phys. 78, 1992 (1995)Google Scholar
[9] Eiche, C., Maier, D., Sinerius, D., Weese, J., Benz, K. W. and Honerkamp, J., J.Appl.Phys. 74, 6667 (1993)Google Scholar
[10] Zielinger, J. P., Tapiero, M., Guellil, Z., Roosen, G., Delaye, P., Launay, J. C. and Mazoyer, W., Mat.Sci.Eng. B16, 273 (1993)Google Scholar
[11] Lopez-Cruz, E., Gonzalez-Hernandez, J., Allred, D. D. and Allred, W. P. J.Vac.Sci.Technol. A8, 1934 (1990)Google Scholar
[12] Samimi, M., Biglari, B., Hage-Ali, M., Koebel, J. M. and Siffert, P., Phys.Stat.Sol.(a) 100, 251 (1987)Google Scholar
[13] Tapierov, M., Benjelloun, N., Zielinger, J. P., Hamd, S.El, and Noguet, C. J.Appl.Phys. 64 4006 (1988).Google Scholar
[14] Hofmann, D. M., Stadler, W., Oettinger, K., Meyer, B. K., Omling, P., Salk, M., Benz, K. W., Weigel, E. and Müller-Vogt, G., Mat.Sci.Eng. B16, 128 (1993)Google Scholar
[15] Allen, J. W., Semicond.Sci.Technol. 10, 1049 (1995)Google Scholar
[16] Takebe, T., Saraie, J. and Matsunami, H. J.Appl.Phys. 53, 457 (1982).Google Scholar