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Investigating Coherent Zone-Folded Acoustic Phonons in Si/SiGe Superlattices by Transient Thermoreflectance Technique

Published online by Cambridge University Press:  31 January 2011

Hélène Michel ,
Gilles Pernot ,
Jean-Michel Rampnoux ,
Stefan Dilhaire ,
Stéphane Grauby ,
Younès Ezzahri  and
Ali Shakouri
Hélène Michel
Affiliation:
[email protected], University of California Santa cruz, Baskin School of Engineering, Santa cruz, California, United States
Gilles Pernot
Affiliation:
[email protected], Université de Bordeaux 1, CPMOH, Talence, France
Jean-Michel Rampnoux
Affiliation:
[email protected], Université de Bordeaux 1, CPMOH, Talence, France
Stefan Dilhaire
Affiliation:
[email protected], Université de Bordeaux 1, CPMOH, Talence, France
Stéphane Grauby
Affiliation:
[email protected], Université de Bordeaux 1, CPMOH, Talence, France
Younès Ezzahri
Affiliation:
[email protected], University of California Santa cruz, Baskin School of Engineering, Santa cruz, California, United States
Ali Shakouri
Affiliation:
[email protected], University of California Santa cruz, Baskin School of Engineering, Santa cruz, California, United States
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Abstract

In this paper, we present a systematic study of coherent phonons in Si/SiGe superlattices with two different periods. The superlattice periodicity affects the acoustic properties of the structure. Transient thermoreflectance (TTR) technique is used to perform picosecond ultrasonics experiments and then, investigate coherent zone-folded acoustic phonons in different Si/SiGe superlattice structures. Several classes of coherent phonons are produced in the superlattice, whose generation mechanisms are different: Brillouin oscillations, coherent longitudinal-acoustic phonon Bragg reflection and impulsive stimulated Raman scattering (ISRS).

Keywords

acousticlasernanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1221: Symposium CC – Phonon Engineering for Enhanced Materials Solutions–Theory and Applications , 2009 , 1221-CC08-03
Copyright
Copyright © Materials Research Society 2010

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