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Interface Structure and Solid State Reactions of Fe/Zr Multilayers

Published online by Cambridge University Press:  25 February 2011

Bruce M. Clemens  and
D. L. Williamson
Bruce M. Clemens
Affiliation:
Physics Department. General Motors Research Laboratories Warren, Michigan 48090-9055
D. L. Williamson
Affiliation:
Department of Physics, Colorado School of Mines, Golden Colorado 80401
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Abstract

Iron zirconium multilayer films were prepared by electron beam evaporation and by sputter deposition. Layer thicknesses were varied from 50 monolayers of each constituent down to 2 monolayers. Conversion electron Mössbauer spectroscopy, x-ray diffraction, and Auger spectroscopy have been used to characterize multilayers in the as-deposited and annealed state. Amorphous phase formation occurs during thermal anneals, and samples with layer thicknesses of 5 monolayers or less of each constituent are amorphous as deposited. Amorphous interfaces are observed in all samples, with this interface region being larger in the electron beam evaporated samples than in the sputter deposited samples.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 103 , 1987 , 159
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1.Clemens, B. M. and Suchoski, M. J., Appl. Phys. Lett. 47, 943 (1985).Google Scholar
2.Krebs, H. U., Webb, D. J. and Marshall, A. F..Phys. Rev. B 35, 3592 (1987).Google Scholar
3.Schwarz, R. B. and Johnson, W. L., Phys. Rev. Lett. 51, 415 (1983).Google Scholar
4.Clemens, B. M., Phys. Rev. B 33(11). 7615 (1986).Google Scholar
5.Schöbder, H. and Samwer, K., Phys. Rev. Lett. 54, 197 (1985).Google Scholar
6.Cheng, Y.-T., Johnson, W. L., and Nicolet, M.-A.. Appl. Phys. Lett. 47, 800 (1985).Google Scholar
7.Heald., S. M.Tranquada, J. M., Clemens, B. M., and Stec, J. P.. Proceedings of The Fourth International Conference on EXAFS, Abbaye Royale de Sontevraud, France, (July 1986).Google Scholar
8.Clemens., B. M.Stec, J. P., Heald, S. M., and Tranquada, J. M., Interfaces, Superlattices, and Thin Films, Materials Research Society Proceedings. (1987).Google Scholar
9.Lin, C.-J., Spaepen, F., and Turnbull, D., J. Non. Cryst. Solids 61&62, 767 (1984).Google Scholar
10.Kahn., M. R.Chun, C. S. L., Felcher, G. P., Grimsditch, M., Kueny, A., Falco, C. M., and Schuller, I. K., Phys. Rev. B 27. 7186 (1983).Google Scholar
11.Liljequist, D.Ekdahl, T., and Bäverstam, U., Nucl. Instrum. Meth. 166. 49 (1978).Google Scholar
12.Bartram, S. F., Crystallite size determination from line broadening and spotty patterns In Handbook of X-Rays For Diffraction, Emission, Absorption, and Microscopy Kaelble, Emmett F., editor, (McGraw Hill, New York, 1967) P. 17–13.Google Scholar
13.Sette-Camora, A. and Keune, W., Corros. Sci. 15, 441 (1975).Google Scholar
14.Deeny, F. L. and Mcarthy, P. J.. Nucl. Instrum. Meth. 166, 49 (1979).Google Scholar
15.Williamson, D. L., Kustas, F. M., Fobare, D. F., and Mishra, M. S., J. of Appl. Phys. 60. 1493 (1986).Google Scholar
16.Clemens, B. M. and Gay, J. G.. Phys. Rev. B Rapid Comm. 35, 9337 (1987).Google Scholar
17.Williamson, D. L. and Clemens, B. M., Hyperfine Interactions (In press). (1987).Google Scholar
18.Unruh, K. M. and Chien, C. L.. Phys. Rev. B 30, 4968 (1984).Google Scholar
19.Meads, R. E., Place, B. M., Woodhams, F. W. D., and Clark, R. C.. NucI. Instrum.Meth. 98, 29 (1972).Google Scholar
20.Wender, S. A. and Hershkowitz, N.. Nucl. Instrum. Meth. 98, 105 (1972).Google Scholar
21.Aubertin, F., Gonser., U.Campbell, S. J., and Wagner, H-G., Z. Metallk. 76, 237 (1985).Google Scholar
22.Maurer, M., Friedt, J. M., and Sanchez, J. P., J. Phys. F 15, 1449 (1985).Google Scholar
23.Jaggi, N. K., Schwartz, L. H., Wong, H. K. and Ketterson, J. B., Magn, J.. and Magn. Matrls. 49. 1 (1985).Google Scholar
24.Kawaguchi, K., Yamamoto, R., Hosoito, N., Shinjo, T.. and Takada, T.. J. Phys. Soc.Jpn. 55. 2375 (1986).Google Scholar
25.Wertheim, G. K., Jaccarino, Y., Wernick, J. H., and Clark, R. C., Phys. Rev. Lett. 12, 24 (1964).Google Scholar
26.Reimer, R. P. and Gay, J. G.. (private communication) 1987.Google Scholar
27.Clemens, B. M., J. of Appl. Phys. 61. 4525 (1987).Google Scholar