Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-29T08:21:17.275Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Situ Techniques for Studying Epitaxially Grown Layers and Determining their Magnetic Properties

Published online by Cambridge University Press:  03 September 2012

B. Heinrich ,
A. S. Arrott ,
J. F. Cochran ,
K. B. Urquhart ,
K. Myrtle ,
Z. Celinski  and
Q. M. Zhong
B. Heinrich
Affiliation:
Surface Physics Laboratory, Physics Department, Simon Fraser University, Burnaby BC, CANADA V5A-1S6
A. S. Arrott
Affiliation:
Surface Physics Laboratory, Physics Department, Simon Fraser University, Burnaby BC, CANADA V5A-1S6
J. F. Cochran
Affiliation:
Surface Physics Laboratory, Physics Department, Simon Fraser University, Burnaby BC, CANADA V5A-1S6
K. B. Urquhart
Affiliation:
Surface Physics Laboratory, Physics Department, Simon Fraser University, Burnaby BC, CANADA V5A-1S6
K. Myrtle
Affiliation:
Surface Physics Laboratory, Physics Department, Simon Fraser University, Burnaby BC, CANADA V5A-1S6
Z. Celinski
Affiliation:
Surface Physics Laboratory, Physics Department, Simon Fraser University, Burnaby BC, CANADA V5A-1S6
Q. M. Zhong
Affiliation:
Surface Physics Laboratory, Physics Department, Simon Fraser University, Burnaby BC, CANADA V5A-1S6
Get access

Abstract

Ultrathin films of bcc Fe (001) on Ag (001) and Fe/Ni (001) bilayers on Ag were grown by molecular beam epitaxy. A wide range of surface science tools (RHEED, REELFS, AES, and XPS) were employed to establish the quality of epitaxial growth. Ferromagnetic resonance and Brillouin light scattering were used to extract the magnetic properties. Emphasis was placed on the study of magnetic anisotropies. Large uniaxial anisotropies with the easy axis perpendicular to the film surface were observed in all ultrathin structures studied. In sufficiently thin samples the saturation magnetization was oriented perpendicular to the film surface in the absence of an applied field. It has been demonstrated that in bcc Fe films the uniaxial perpendicular anisotropy originates at the film interfaces. Fe/Ni bilayers were also investigated. Ni grows in the pure bcc structure for the first 3–6ML and then transforms to a new structure which exhibits unique magnetic properties. Transformed ultrathin bilayers possesses large in-plane 4th order anisotropies far surpassing those observed in bulk Fe and Ni. The large 4th order anisotropies originate in crystallographic defects formed during the Ni lattice transformation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 151: Symposium G – Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers , 1989 , 177
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Fu, C.L., Freeman, A.J. and Oguchi, T., Phys. Rev. Lett. 54, 2700 (1985).CrossRefGoogle Scholar
2. Moruzzi, V.L. and Marcus, P.M., Phys. Rev. B38. 613 (1988).Google Scholar
3. Gay, J.G. and Richter, Roy, Phys. Rev. Lett.,56. 2728 (1986).Google Scholar
4. Heinrich, B., Urquhart, K.B., Dutcher, J.R., Purcell, S.T., Cochran, J.F., Arrott, A.S., Steigerwald, D.A., and Egelhoff, W.F. Jr., J. Appl. Phys. 63. 3863 (1988).CrossRefGoogle Scholar
5. Heinrich, B., Urquhart, K.B., Arrott, A.S., Cochran, J.F., Myrtle, K. and Purcell, S.T., Phys. Rev. Lett. 59, 1756 (1987).Google Scholar
6. Heinrich, B., Arrott, A.S., Cochran, J.F., Liu, C. and Myrtle, K., J. Vac. Sci. Technol. A4 1376 (1986).Google Scholar
7. Heinrich, B., Arrott, A.S., Cochran, J.F., Purcell, S.T., Urquhart, K.B., Alberding, N., and Liu, C., Thin Film Techniques for Low Dimensional Structures edited by R.F.C., Farrow et al. (Plenum Press, New York, 1987), p. 521.Google Scholar
8. Heinrich, B., Arrott, A.S., Cochran, J.F., Purcell, S.T., Urquhart, K.B. and Myrtle, K., J. Cryst. Growth 81 562 (1987).CrossRefGoogle Scholar
9. Wang, Z.Q., Li, Y.S., Jona, F. and Marcus, P.M., Sol. St. Com. 61. 623 (1987).CrossRefGoogle Scholar
10. Heinrich, B., Purcell, S.T., Dutcher, J.R., Urquhart, K.B., Cochran, J.F. and Arrott, A.S., Phys. Rev. B38. 12879 (1988).Google Scholar
11. Jiang, D., Crozier, E.D., Alberding, N. and Heinrich, B. (to be published).Google Scholar
12. Seah, M.P. and Dench, W.A., Surface and Interface Analysis 1. 2 (1979).CrossRefGoogle Scholar
13. Cochran, J.F. and Dutcher, J.R., J. Magn. Magn. Matr. 73 299 (1988).Google Scholar
14. Kambersky, V., Czech. J. Phys. B26. 1366 (1976).Google Scholar
15. Heinrich, B., Cochran, J.F. and Hasegawa, R., J. Appl. Phys. 57 3690 (1985).CrossRefGoogle Scholar
16. Jonker, B.T., Walker, K.H., Kisker, E., Prinz, G.A. and Carbone, C., Phys. Rev. Lett. 57 142 (1986).Google Scholar
17. Stampanoni, M., Vaterlaus, A., Aeschlimann, M. and Meier, F., Phys. Rev. Lett. 59. 2483 (1987).CrossRefGoogle Scholar
18. Volkening, F.A., Jonker, B.T., Krebs, J.J., Koon, N.C., and Prinz, G.A., J. Appl. Phys. 63. 3869 (1988).Google Scholar
19. Krebs, J.J., Jonker, B.T., and Prinz, G.A., J. Appl. Phys. 6. 3467 (1988).Google Scholar
20. Urquhart, K.B., Heinrich, B., Cochran, J.F., Arrott, A.S., and Myrtle, K., J. Appl. Phys. 64, 5334 (1988).CrossRefGoogle Scholar
21. Our previously reported values of Ks in ultrathin Fe films covered by Au4,5 were multiplied by mistake by a factor D⊥ which resulted in an apparent stronger dependence of Ks on the sample thickness.Google Scholar
22. Jonker, B.T., Krebs, J.J. and Prinz, G.A., J. Appl. Phys. 64, 5340 (1988).CrossRefGoogle Scholar
23. Chappert, C. and Bruno, P., J. Appl. Phys. 64. 5736 (1988).CrossRefGoogle Scholar
24. Purcell, S.T., Heinrich, B. and Arrott, A.S., J. Appl. Phys. 64, 5337 (1988).Google Scholar
25. Dutcher, J.R., Cochran, J.F., Heinrich, B. and Arrott, A.S., J. Appl. Phys. 64, 6095 (1988).Google Scholar
26. Karas, W., Noffke, J. and Fritsche, L., 12th International Colloquium on Magnetic Films and Surfaces, Le Creusot, France (1988).Google Scholar
27. Artman, J.O., Phys. Rev. 105, 62 (1957).CrossRefGoogle Scholar