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InGaAs/GaAs Graded Superlattices in Photodetectors for Wavelengths Beyond 1 μm

Published online by Cambridge University Press:  28 February 2011

R. Mariella
Affiliation:
Lawrence Livermore National Lab., PO Box 808, MS L228, Livermore, CA 94550
J. Morse
Affiliation:
Lawrence Livermore National Lab., PO Box 808, MS L228, Livermore, CA 94550
Z. Liliental-Weber
Affiliation:
Lawrence Berkeley Lab., 1 Cyclotron Rd., 62-203, Berkeley, CA 94720
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Abstract

We have used MBE to grow graded InxGa1−xAs/GaAs superlattices on GaAs substrates as buffers for larger period, constant composition InxGa1−xAs/GaAs superlattices. TEM analysis shows that there are numerous crystal defects associated with the presence of strained layers, but, in many cases, the buffer layers confine these defects to areas outside of the strained-layer superlattices. PIN detectors fabricated from these structures show external quantum efficiencies up to 2.7 %.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

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