Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T15:23:55.313Z Has data issue: false hasContentIssue false
  • English
  • Français

Infrared Optical Guided Modes in Plasma Deposited Gold Clusters Embedded in a Polymer Matrix

Published online by Cambridge University Press:  28 February 2011

F. Parmigiani ,
M. Jurichi ,
E. Kay  and
J.D. Swalen
F. Parmigiani
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA 95120-6099
M. Jurichi
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA 95120-6099
E. Kay
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA 95120-6099
J.D. Swalen
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA 95120-6099
Get access

Abstract

Measurements of the refractive index of discontinuous metallic films, consisting of gold clusters embedded in a dielectric matrix prepared in a capacitively coupled coplanar diode radio frequency discharged system, are reported.

These composite films were analyzed to determine the metal volume fraction, the thickness and the cluster size.

Optical characterizations in the visible and near infrared regions of the electromagnetic spectrum, particularly, in the near-IR region (Nd/YAG laser wavelength 1.0642 μm), where the absorption coefficient of these materials is very low (k < 0.001) were performed. Optical guided modes analysis allowed careful measurement of the effective medium refractive index.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 195: Symposium S – Physical Phenomena in Granular Materials , 1990 , 25
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] See for example Norman, S., Anderson, T., Granqvist, C. G. and Hunderi, O., Phys. Rev. B, 18, 674 (1978) and references therein.Google Scholar
[2] Sheng, P., Phys. Rev. Lett., 45, 60 (1980).Google Scholar
[3] Perrin, J., Despax, B. and Kay, E., Phys. Rev. B 32, 719 (1985).Google Scholar
[4] Perrin, J., Despax, B., Hlanchett, V. and Kay, E., J. Vac. Sci. and Tech. A4, 46 (1986).Google Scholar
[5] Laurent, C., Kay, E. and Souag, N., J. Appl. Phys. 64, 336 (1988).Google Scholar
[6] Swalen, J. D., Santo, R., Tacke, M. and Fischer, J., “Properties of Polymeric Thin Films by Integrated Optics Techniques,” IBM J. Res. Dev. 21, 168 (1977).Google Scholar
[7] Rabolt, J. F. and Swalen, J. D., in Clark, R. J. H. and Hester, R. E. (Eds.), Spectroscopy of Surfaces (Wiley, New York, 1988) pp. 1–36.Google Scholar