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Published online by Cambridge University Press: 26 February 2011
The effect of the group V isoelectronic dopant antimony (Sb) on the optimum growth temperature for GaAs and AIGaAs MBE grown films is examined with the aim of producing heterostructures at the lowest possible temperatures. RHEED intensity oscillations have been used to quantify the incorporation rate of Ga, Al, and As for different growth temperatures. The electrical properties of the layers are characterized using photoluminescence spectroscopy (PL), Hall mobility measurements, and deep level transient spectroscopy (DLTS). Results show that isoelectronic Sb doping of GaAs and AIGaAs permits the growth of these materials at temperatures up to 800C lower than optimum, with deep level trap densities, photoluminescence quality, and Hall mobilities at least comparable or better than those films grown at optimal temperatures.