Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-27T02:06:01.635Z Has data issue: false hasContentIssue false

Influence of Layer Structure on Antiferromagnetic Exchange Coupling of Iron Films through Chromium Interlayers

Published online by Cambridge University Press:  26 February 2011

A.P. Payne
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
H. Kataoka
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
M. Farle
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
B.M. Clemens
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
Get access

Abstract

The effect of layer structure perturbations on antiferromagnetic coupling in Fe-Cr-Fe trilayer systems is investigated. By varying the sputtering pressure, the layer structure of Fe-Cr-Fe trilayers is systematically altered, as indicated by changes in the low angle superlattice spectra of multilayers fabricated under identical conditions. The effect of topographic roughness is investigated by fabricating identical trilayers on Cr buffer layers of different thickness. Scanning tunneling microscopy is used to measure surface roughness. In each case the saturation field is measured as a function of Cr interlayer thickness by means of tapered Cr interlayer structures in which the thickness of the spacer varies linearly from 0 to 28 Å upon a single substrate. Antiferromagnetic coupling is measured locally by means of the magneto-optic Kerr effect. Results show that although the coupling is diminished by structural perturbations, it is a remarkably robust effect which persists even in instances of poor layer structure.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Grünberg, P., Schreiber, R., Pang, Y., Brodsky, M.B., Sowers, H., Phys Rev Lett. 57 (19), (1986).Google Scholar
[2] Carbone, C., Alvarado, S.F., Phys. Rev. B. 36 (4), (1987).Google Scholar
[3] Saurenbach, F., Walz, U., Hinchey, L., Grinberg, P., Zinn, W., J. Appl. Phys. 63 (8), (1988).Google Scholar
[4] Parkin, S.S.P., More, N., Roche, K.P., Phys. Rev. Lett. 64 (19), (1990).CrossRefGoogle Scholar
[5] Baibich, M.N., Broto, J.M., Fert, A., Dau, F. Nguyen Van, Petroff, F., Eitenne, P., Creuzet, G., Friederich, A., Chazelas, J., Phys. Rev. Lett. 61 (21), (1988).Google Scholar
[6] Binasch, G., Grünberg, P., Saurenbach, F., Zinn, W., Phys. Rev. B. 39 (7),(1989).Google Scholar
[7] Thornton, J.A. and Hoffman, D.W., J. Vac. Sci. Technol. 14, (1977).Google Scholar
[8] Oecheuer, H., Appl. Phys. 8, 185, (1975).Google Scholar
[9] Meyer, K., Shuller, I.K., Falco, C.M., J. Appl. Phys. 52 (9), (1981).Google Scholar
[10] Grünberg, P., Barnas, J., Fugl, A., Vohl, M., Wolf, J.A., presented at the 1990 E-MRS Meeting, Strasbourg, France (1990),(unpublished).Google Scholar
[11] Baberschke, K., Zomak, M., Farle, M. in Magnetic Properties of Low-Dimensional Systems, edited by Falicov, L.M.. and Moran-Lopez, Y.L., Springer Proc. in Physics 14 (84)(Springer, Berlin, 1986)Google Scholar
[12] Li, Yi, Farle, M., and Baberschke, K., Phys Rev. B. 41(956) (1990).Google Scholar
[13] Grünberg, P., Demokritov, S., Full, A., Vohl, M., Wolf, J.A., presented at the 1990 Conference on Magnetism and Magnetic Materials, San Diego, CA. (unpublished).Google Scholar