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The Influence of Diamond Surface Perfection on the Preferential Nucleation of SP2 Carbon During Methane Pyrolysis

Published online by Cambridge University Press:  25 February 2011

B. Y. Lin ,
C. P. Beetz ,
D. W. Brown  and
B. A. Lincoln
B. Y. Lin
Affiliation:
Advanced Technology Materials 7 Commerce Drive, Danbury, CT 06810
C. P. Beetz
Affiliation:
Advanced Technology Materials 7 Commerce Drive, Danbury, CT 06810
D. W. Brown
Affiliation:
Advanced Technology Materials 7 Commerce Drive, Danbury, CT 06810
B. A. Lincoln
Affiliation:
Advanced Technology Materials 7 Commerce Drive, Danbury, CT 06810
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Abstract

We report a set of CH4 pyrolysis experiments in a UHV system on diamond surfaces having varying degrees of surface roughness or perfection. Scanning electron microscopy (SEM), Auger electron spectroscopy (AES) and reflection high energy electron diffraction (RHEED) were used to examine the formation of graphite and the resulting surface morphologies. A (100) type Ha natural diamond having 3 sputtered craters on the surface was used as the substrate, sp2 carbon was formed preferentially on the structurally defective crater surfaces after ∼3×1010 L of CH4 exposure at 900°C, whereas essentially no sp2 carbon was found on the flat portions of the diamond surface. Similar experiments were also carried out on a polycrystalline CVD diamond film and sp2 carbon was formed on that surface afte ∼4×109 L of CH4 exposure at 900°C. These results indicate that structural defects on diamond surfaces are a crucial factor in the preferential nucleation of sp2 carbon during CH4 pyrolysis.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 280: Symposium B – Evolution of Surface and Thin Film Microstructure , 1992 , 705
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1 Matsumoto, S., Sato, Y., Kamo, M. and Setaka, N., Jpn. J. Appl. Phys. 21 L183. (1982).CrossRefGoogle Scholar
2 Suzuki, K., Uasuda, J., and Inuzuka, T., Appl. Phys. Lett 50 728 (1987).Google Scholar
3 Matsumoto, S., Hino, M. and Kobayashi, T., Appl. Phys. Lett. 51 737 (1987).CrossRefGoogle Scholar
4 Kamo, M., Sato, Y., Matsumoto, S. and Setaka, M., J. Cryst growth 62 642 (1983).Google Scholar
5 Hirose, Y., and Kondo, N., Materials Letters 7 289 (1991).Google Scholar
6 Patterson, D., Chu, J., Bai, B., Xiao, Z., Komplin, M., Margrave, J. L. and Jauge, R. H., J. Electrochem. Soc. 138 No 3 (1991).Google Scholar
7 Fedoseev, D. V., Varnin, V. P. and Deryagin, B. V., Russian Chemical Reviews, 53, 435 (1984).CrossRefGoogle Scholar
8 Angus, J. C. and Hayman, C. C., Science, 241, 913 (1988).Google Scholar
9 Yarbrough, W. A. and Messier, R., Science, 247, 688 (1990).CrossRefGoogle Scholar
10 Angus, J. C., Will, H. A. and Stanko, W. S., J. Appl. Phys., 39, 2915 (1968).Google Scholar
11 Chauhan, S. P., Angus, J. C., and Gardner, N. C., J. Appl. Phys., 47, 4746 (1976).CrossRefGoogle Scholar
12 Stevie, F. A., Kahora, P. M., Simons, D. S., and Chi, P., J. Vac. Sci. Technol. A6 76 (1988).Google Scholar
13 Wilson, R. G., Stevie, F. A., Magie, C. W., “Secondary Ion Mass Spectroscopy”, John Wiley & Sons NY (1989).Google Scholar
14 Lurie, P. G. and Wilson, J. M., Surf. Sci., 65 476 (1977).CrossRefGoogle Scholar
15 Venables, J. A., Spiller, G. D. T. and Hanbucken, M., Rept. Prog. Phys. 47, 399 (1984).Google Scholar
16 See for example Cappelli, M. A., Owano, T. G., and Kruger, C. H., J. Mater. Res., 5, 2326 (1990).CrossRefGoogle Scholar