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Hyperspectral Imaging of Photovoltaic Conversion

Published online by Cambridge University Press:  14 July 2014

Jean-François Guillemoles*
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France NextPV, RCAST/CNRS, Tokyo University, 4-6-1 Komaba, Meguro-ku Tokyo 153-8904, Japan.
Amaury Delamarre
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France NextPV, RCAST/CNRS, Tokyo University, 4-6-1 Komaba, Meguro-ku Tokyo 153-8904, Japan.
Gilbert El-Hajje
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France
P. Rale
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France
J. Rodière
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France
D. Ory
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France
Myriam Paire
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France
Daniel Lincot
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France
Kentaroh Watanabe
Affiliation:
NextPV, RCAST/CNRS, Tokyo University, 4-6-1 Komaba, Meguro-ku Tokyo 153-8904, Japan.
Masakazu Sugiyama
Affiliation:
NextPV, RCAST/CNRS, Tokyo University, 4-6-1 Komaba, Meguro-ku Tokyo 153-8904, Japan.
Laurent Lombez*
Affiliation:
IRDEP, Institute of R&D on Photovoltaic Energy, UMR 7174, CNRS-EDF-Chimie ParisTech 6 Quai Watier-BP 49, 78401 Chatou cedex, France
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Abstract

We analyze photoluminescence (PL) and electroluminescence (EL) using a hyperspectral imager that records spectrally resolved luminescence images of solar cell absorbers. The system is calibrated to yield the luminescence flux in absolute values. This system enables to quantitatively image physical parameters such as the photovoltage with an uncertainty of less than 30mV. The wide field illumination, low power excitation and fast acquisition brings new insights compared to classical setups such as confocal microscope. Several types of absorbers have been analyzed. For instance, we can investigate spatial fluctuations of the Quasi Fermi Levels splitting in CIGS polycristalline absorbers and link those fluctuations to transport properties. The method is general to the point that third generation PV cells absorbers can also be evaluated. We illustrate the great potential of our setup by imaging carrier temperature in Hot Carriers Solar cells absorbers and quasi Fermi levels splitting in Intermediate Band Solar cells.

Type
Articles
Copyright
Copyright © Materials Research Society 2014 

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References

REFERENCES

Delamarre, A., Lombez, L., and Guillemoles, J. F., Appl. Phys. Lett. 100, 131108, 2012 10.1063/1.3697704CrossRefGoogle Scholar
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Delamarre, A., Lombez, L., and Guillemoles, J.-F., Progress in Photovoltaics, in revision Google Scholar
Rale, P. et al. , to be submitted Google Scholar