Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-29T07:55:14.321Z Has data issue: false hasContentIssue false

Hreels Studies of KxC60 Thin Films

Published online by Cambridge University Press:  15 February 2011

G.P. Lopinski
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
M.G. Mitch
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
S.J. Chase
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
J.S. Lannin
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
Get access

Abstract

High resolution electron energy loss spectroscopy has been used to investigate the vibrational and electronic excitations of single-phase, crystalline AxC60 films. Substantial changes in intramolecular mode frequencies and intensities with alkali concentration arise from charge transfer effects as well as free carrier screening. For x=4, splitting of the t1u band is observed, resulting in an insulating phase with an estimated gap of 0.3-0.4eV. Screening in the x=3 phase results in enhanced surface sensitivity and deviations from bulk stoichiometry at the surface of metallic films are observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Stepniak, F., Benning, P.J., Poirier, D.M., and Weaver, J.H., Phys. Rev. B48, 1899 (1993).Google Scholar
[2] Benning, P.J., Stepniak, F., and Weaver, J.H., Phys. Rev. B48, 9086 (1993).Google Scholar
[3] Sohmen, E. and Fink, J., Phys. Rev. B47, 14532 (1993).Google Scholar
[4] Gensterblum, G. et al. , Phys. Rev. Lett. 67, 2171 (1991).Google Scholar
[5] Gensterblum, G. et al. , J. Phys. Chem. Solids 53, 1427 (1992).Google Scholar
[6] Gensterblum, G. et al. , Appl. Phys. A56, 175 (1993).Google Scholar
[7] Modesti, S., Cerasari, S., and Rudolf, P., Phys. Rev. Lett. 71, 2469 (1993).Google Scholar
[8] Jiang, L.Q. and Koel, B.E., Phys. Rev. Lett. 72, 140 (1994).Google Scholar
[9] Poirier, D.M., Appl. Phys. Lett. 64, 1356 (1994).Google Scholar
[10] Benning, P.J. et al. , Phys. Rev. B45, 6899 (1992).Google Scholar
[11] Lof, R.W., Veenendaal, M.A. van, Koopmans, B., Jonkman, H.T., and Sawatzky, G.A., Phys. Rev. Lett. 68, 3924 (1992).Google Scholar
[12] Erwin, S.C. in Buckminsterfullerenes, eds. Billups, W.E. and Ciufolini, M.A. (VCH, New York, 1992).Google Scholar
[13] Palmer, R.E., Annett, J.F., and Willis, R.F., Phys. Rev. Lett. 58, 2490 (1987).Google Scholar
[14] Iwasa, Y. et al. , J. Phys. Chem. Solids 54, 1795 (1993).Google Scholar
[15] Benning, P.J. et al. , Phys. Rev. 47, 13843 (1993).Google Scholar
[16] Erwin, S.C. and Bruder, C., Physica B 199–200, 600 (1994).Google Scholar
[17] Mitch, M.G., Lopinski, G.P., Chase, S.J., and Lannin, J.S., Phys. Rev. B, to be published. Google Scholar
[18] Martin, M.C., Koller, D., and Mihaly, L., Phys. Rev. B47, 14607 (1993).Google Scholar
[19] Fu, K.J. et al. , Phys. Rev. B46, 1937 (1992).Google Scholar
[20] Pichler, T., Matus, M., and Kuzmany, H., Solid State Commun. 86, 221 (1993).Google Scholar
[21] Rice, M.J. and Choi, H.Y., Phys. Rev. B45, 10173 (1992).Google Scholar
[22] Cox, P.A., Hill, M.D., Peplinskii, F., and Egdell, R.G., Surf. Sci. 141, 13 (1984).Google Scholar
[23] Coulombeau, C. et al. , C.R. Acad. Sci. Paris 313, 1387 (1991).Google Scholar
[24] Prassides, K. et al. , Chem. Phys. Lett. 187, 455 (1991).Google Scholar
[25] Wertheim, G.K., Buchanan, D.N.E., Chaban, E.E., and Rowe, J.E., Solid State Commun. 83, 785 (1992).Google Scholar