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A Home-Made Inch-Scale Scanning Force “Microscope”

Published online by Cambridge University Press:  01 February 2011

Claudio Guerra-Vela
Affiliation:
University of Puerto Rico, Department of Physics, 100 Tejas Street, Humacao, PR 00791–4300
Fredy R. Zypman
Affiliation:
Yeshiva University, Department of Physics, 500 West 185th Street, New York, NY 10033
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Abstract

We developed a foot-long aluminum “microscope” cantilever to use in our undergraduate laboratory. The detection mechanism is by means of a vibrating piezoelectric. The tip-sample interaction is obtained by means of springs attached at the end of the cantilever. The main objective is to provide students with a large cantilever from where they can build an intuitive feel of the instrument. Also, and perhaps more important, we teach the student how to extract forces from kinematics data. We let the cantilever move under the action of the interaction force, and record that motion as a voltage produced by the vibrating piezoelectric. That voltage is then processed to reproduce the F-d (Force-distance) curve. As opposed to what happens in the real microscope, in our case we have access to the sources of force and thus we can check the accuracy of our reconstruction algorithm by comparing our reconstructed Fd curve with the known one.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

1 Atomic Force Microscopy/Scanning Tunneling Microscopy,” Cohen, S. H., Bray, M. T., Lightbody, M. L., Plenum Press, New York, NY, 1994.Google Scholar
2 High Frequency Response of a Scanning Force Microscope Cantilever”, Zypman, Fredy R., Eppell, Steven J., J Vac Sci Technol B16, 20992101 (1998)Google Scholar
3 Radio Shack piezoelectric buzzer, Cat. No. 273–075bGoogle Scholar