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High-Z Lanthanum-Cerium Hexaborate Thin Films for Low-Temperature Applications

Published online by Cambridge University Press:  01 February 2011

Armen Kuzanyan ,
George Badalyan ,
Sergey Harutyunyan ,
Ashot Gyulamiryan ,
Violetta Vartanyan ,
Silvia Petrosyan ,
Nicholas Giordano ,
Todd Jacobs ,
Kent Wood  and
Gilbert Fritz
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Armen Kuzanyan
Affiliation:
Institute for Physics Research, National Academy of Sciences, Ashtarak-2, 378410, Armenia.
George Badalyan
Affiliation:
Institute for Physics Research, National Academy of Sciences, Ashtarak-2, 378410, Armenia.
Sergey Harutyunyan
Affiliation:
Institute for Physics Research, National Academy of Sciences, Ashtarak-2, 378410, Armenia.
Ashot Gyulamiryan
Affiliation:
Institute for Physics Research, National Academy of Sciences, Ashtarak-2, 378410, Armenia.
Violetta Vartanyan
Affiliation:
Institute for Physics Research, National Academy of Sciences, Ashtarak-2, 378410, Armenia.
Silvia Petrosyan
Affiliation:
Institute for Physics Research, National Academy of Sciences, Ashtarak-2, 378410, Armenia.
Nicholas Giordano
Affiliation:
Physics Department, Purdue University, West Lafayette, IN 47907.
Todd Jacobs
Affiliation:
Naval Research Laboratory, Washington, DC 20375.
Kent Wood
Affiliation:
Naval Research Laboratory, Washington, DC 20375.
Gilbert Fritz
Affiliation:
Naval Research Laboratory, Washington, DC 20375.
Syed B. Qadri
Affiliation:
Naval Research Laboratory, Washington, DC 20375.
James Horwitz
Affiliation:
Naval Research Laboratory, Washington, DC 20375.
Huey-Dau Wu
Affiliation:
Naval Research Laboratory, Washington, DC 20375.
Deborah Van Vechten
Affiliation:
Office of Naval Research, Arlington, VA 22217
Armen Gulian
Affiliation:
Universities Space Research Association/ Naval Research Laboratory, Washington, DC 20375.
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Abstract

We have deposited and investigated thin films of lanthanum hexaborate with 1% of the lanthanum replaced by cerium. In bulk single-crystalline form, this material has, due to the Kondo-mechanism, the highest known Seebeck coefficient at sub-K temperatures. Thus it is a good candidate for several thermoelectric applications at very low temperatures. We are studying the kinetic properties of thin films such as the conductivity and Seebeck coefficient as a function of temperature and the dependence of these properties on film thickness, substrate material and deposition conditions. The consequent theoretical performance limits on the device applications of these films are considered with a focus on detectors and refrigerators.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 626: Symposium Z – Thermoelectric Materials 2000 - The Next Generation Materials for Small-Scale Refrigeration and Power Generation Applications , 2000 , Z8.21
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

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