Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-25T15:42:40.192Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Speed Epitaxy Using Supersonic Molecular Jets

Published online by Cambridge University Press:  26 February 2011

Djula Eres
Djula Eres*
Affiliation:
Oak Ridge National Laboratory, Solid State Division, Oak Ridge, TN.
Get access

Abstract

This paper discusses the use of supersonic jets of gaseous source molecules in thin film growth. Molecular jets in free form with no skimmers or collimators in the nozzle-substrate path were used in the investigation of basic film growth processes and in practical film growth applications. The Ge growth rates were found to depend linearly on the digermane jet intensity. Furthermore, the film thickness distributions showed excellent agreement with the distribution of digermane molecules in the jet. High epitaxial Ge growth rates were achieved on GaAs (100) substrates by utilizing high-intensity pulsed jets. The practical advantages and limitations of this film growth technique are evaluated, based on the results of microstructural and electrical measurements of heteroepitaxial Ge films on GaAs (100) substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 201: Symposium A – Surface Chemistry and Beam-Solid Interactions , 1990 , 11
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Herman, M. A. and Sitter, H., Molecular Beam Epitaxy, Fundamentals and Current Status, Springer Series in Materials Science, (Springer-Verlag New York, 1989), p. 23.Google Scholar
2. Copel, M., Reuter, M. C., Kaxiras, Efthimios, and Tromp, R. M., Phys. Rev. Lett. 63, 632 (1989).Google Scholar
3. Miller, D. R., in Atomic and Molecular Beam Methods, edited by Scoles, Giacinto, (Oxford University Press, New York, 1988) p. 22.Google Scholar
4. Eres, Djula, Sharp, J. W., and Lowndes, D. H., Mat. Res. Soc. Symp. Proc. 160, 359 (1990).Google Scholar
5. Eres, Djula, Lowndes, D. H., Tischler, J. Z., Sharp, J. W., Haynes, T. E., and Chisholm, M. F., J. Appl. Phys. 67, 1361 (1990).Google Scholar
6. Miller, D. R., in Atomic and Molecular Beam Methods, edited by Scoles, Giacinto, (Oxford University Press, New York, 1988) p. 33.Google Scholar
7. Kawanaka, M. and Sone, J., J. Cryst. Growth, 95, 421 (1989).Google Scholar
8. Madix, R. J., in this symposium.Google Scholar