Hostname: page-component-669899f699-b58lm Total loading time: 0 Render date: 2025-04-27T17:16:45.027Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Resolution Scanning Electron Microscopy and Microanalysis of Supported Metal Catalysts

Published online by Cambridge University Press:  10 February 2011

Jingyue Liu
Jingyue Liu*
Affiliation:
Monsanto Corporate Research, Monsanto Company, 800 N. Lindbergh Blvd., St. Louis, MO 63167
Get access

Abstract

The use of a high-brightness field emission gun and novel secondary electron detection systems makes it possible to acquire nanometer-resolution surface images of bulk materials, even at low electron beam voltages. The advantages of low-voltage SEM include enhanced surface sensitivity, reduced sample charging on non-conducting materials, and significantly reduced electron range and interaction volume. High-resolution images formed by collecting the backscattered electron signal can give information about the size and spatial distribution of metal nanoparticles in supported catalysts. Low-voltage XEDS can provide compositional information of bulk samples with enhanced surface sensitivity and significantly improved spatial resolution. High-resolution SEM techniques enhance our ability to detect and, subsequently, analyze the composition of nanoparticles in supported metal catalysts. Applications of high-resolution SEM imaging and microanalysis techniques to the study of industrial supported catalysts are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 259
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1.Joy, D. C. and Pawley, J. B., Ultramicroscopy 47, p. 80 (1992).Google Scholar
2.Smith, D. J., Yao, M. H., Allard, L. F., and Datye, A. K., Catalysis Letters 31, p. 57 (1995).Google Scholar
3.Liu, J. in Electron Microscopy 1998, Vol. 2, edited by Benavides, H. A. Calderon and Yacaman, M. Jose (Proc. 14th ICLM, Cancun, Mexico 1998) p. 399–400.Google Scholar
4.Liu, J., Microscopy and Microanalysis (2000), in press.Google Scholar
5.Boyes, E. D., Advanced Materials 10, p. 1, 277 (1998).Google Scholar
6.Wollman, D. A., Irwin, K. D., Hilton, G. C., Dulcie, L. L., Newbury, D. E., and Martinis, J. M., J. Microscopy 188, p. 196 (1997).Google Scholar