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High-Resolution Optical Microscopy Of BaXSr1−xTio3 Films

Published online by Cambridge University Press:  10 February 2011

C. Hubert ,
J. Levy ,
A. C. Carter ,
W. Chang ,
J. M. Pond ,
J. S. Horwitz  and
D. B. Chrisey
C. Hubert
Affiliation:
Dept. of Physics, University of Pittsburgh, Pittsburgh, PA 15260, [email protected]
J. Levy
Affiliation:
Dept. of Physics, University of Pittsburgh, Pittsburgh, PA 15260, [email protected]
A. C. Carter
Affiliation:
Naval Research Laboratory, Washington, D.C. 20375
W. Chang
Affiliation:
Naval Research Laboratory, Washington, D.C. 20375
J. M. Pond
Affiliation:
Naval Research Laboratory, Washington, D.C. 20375
J. S. Horwitz
Affiliation:
Naval Research Laboratory, Washington, D.C. 20375
D. B. Chrisey
Affiliation:
Naval Research Laboratory, Washington, D.C. 20375
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Abstract

The ferroelectric polarization of thin films of BaxSr1−xTiO3 is imaged using confocal scanning optical microscopy (CSOM). The thin films are grown by pulsed laser deposition (PLD) on SrTiO3 substrates. Ferroelectric domain structure is imaged by applying a small ac electric field across interdigitated electrodes, and measuring induced reflectivity changes in the film, which are directly related to the polarization. Domain re-orientation is observed by acquiring CSOM images as a function of the dc electric field. Local hysteresis loops are obtained by sweeping the dc electric field at fixed positions on the sample. Micrometer-sized regions exhibit both ferroelectric and paraelectric response, indicating that thermal broadening of the phase transition is largely due to inhomogeneities in the thin films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 493: Symposium U – Ferroelectric Thin Film VI , 1997 , 69
Copyright
Copyright © Materials Research Society 1998

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References

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