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High Resolution Electron Microscopy and Electron Diffraction of YBa2Cu3O7−x

Published online by Cambridge University Press:  28 February 2011

William Krakow
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598, USA
Thomas M. Shaw
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598, USA
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Abstract

Experimental high resolution electron micrographs and computer simulation experiments have been used to evaluate the visibility of the atomic constituents of YBa2Cu3O7−x. In practice, the detection of oxygen has not been possible in contradiction to that predicted by modelling of perfect crystalline material. Preliminary computer experiments of the electron diffraction patterns when oxygen vacancies are introduced on the Cu-O sheets separating Ba layers show the diffuse streaks characteristic of short range ordering.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

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