Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T08:20:31.479Z Has data issue: false hasContentIssue false
  • English
  • Français

HIGH RESOLUTION ELECTRON MICROSCOPE STUDY OF CdTe-Cd0.6Mn0.4 Te SUPERLATTICES

Published online by Cambridge University Press:  28 February 2011

C. CHOI ,
N. OTSUKA ,
L. A. KOLODZIEJSKI  and
R. L. GUNSHOR-a
C. CHOI
Affiliation:
Purdue University, W. Lafayette, IN 47907
N. OTSUKA
Affiliation:
Purdue University, W. Lafayette, IN 47907
L. A. KOLODZIEJSKI
Affiliation:
Purdue University, W. Lafayette, IN 47907
R. L. GUNSHOR-a
Affiliation:
Purdue University, W. Lafayette, IN 47907
Get access

Abstract

Structures of CdTe-Cd0.6Mn0.4Te superlattices which are caused by the lattice mismatch between suterlattice layers have been studied by high resolution electron microscopy (HREM). In thin-layer superlattices, the crystal lattice in each layeris elastically distorted, resulting in the change of the crystal symmetry from cubic to rhombohedral. The presence of the small rhombohedral distrotion has been confirmed through a phase contrast effect in HREM images. In a thick-layer superlattice, the lattice mismatch is accommodated by dissociated misfit dislocations. Burgers vectors of partial misfit dislocations have been identified from the shift of lattice fringes in HREM images.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 56: Symposium H – Layered Structures and Epitaxy , 1985 , 235
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Osbourn, G., J. Appl. Phys., 53, 1587 (1982).CrossRefGoogle Scholar
2. Kolodziejski, L. A., Bonsett, T. C., Gunshor, R. L., Datta, S., Bylsma, R. B., Becker, W. M., and Otsuka, N., Appl. Phys. Lett., 45, 440 (1984).Google Scholar
3. Matthews, J. W. and Blakeslee, A. E., J. Cryst. Growth, 27, 118 (1974).Google Scholar
4. People, R., Bean, J. C., Appi. Phys. Lett., 47, 322 (1985).Google Scholar
5. Brown, J. M., Holonyak, N., Jr., Lundowise, M. J., Dietze, W. T., and Lewis, C. R., Appl. Phys. Lett., 43, 863 (1983).Google Scholar
6.International Tables for X-Ray Crystallography II, (Kynoch, Birmingham, 1972), p. 116.Google Scholar
7. Cowley, J. M., “Diffraction Physics,” (North-Holland, Amsterday, 1975), p. 283.Google Scholar
8. Lu, G., and Cockayne, D.J.H., Physica, B, 116, 646 (1983).Google Scholar