Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-29T09:51:17.582Z Has data issue: false hasContentIssue false
  • English
  • Français

Growth and Erosive Wear Properties of MPCVD Diamond Coatings on Sintered Tungsten Carbide Substrates

Published online by Cambridge University Press:  10 February 2011

S. Amirhaghi ,
H. S. Reehal ,
R. J. K. Wood  and
D. W. Wheeler
S. Amirhaghi
Affiliation:
School of Electrical & Electronic Engineering, South Bank University, London, SEI OAA, UK
H. S. Reehal
Affiliation:
School of Electrical & Electronic Engineering, South Bank University, London, SEI OAA, UK
R. J. K. Wood
Affiliation:
Department of Mechanical Engineering, University of Southampton, S017 lBJ, UK
D. W. Wheeler
Affiliation:
Department of Mechanical Engineering, University of Southampton, S017 lBJ, UK
Get access

Abstract

Adherent diamond coatings up to ∼35 um thick have been grown by microwave plasma CVD (MPCVD) on sintered tungsten carbide (WC) substrates and their erosive wear properties investigated under high velocity air-sand erosion testing. Two different sintered tungsten carbide (WC) substrates have been investigated and compared, the binder being either 6%Co or 5%Ni by weight. Coating properties are sensitive functions of surface pre-treatment and deposition procedures. Adherent coatings offer significantly better erosion resistance compared to uncoated substrates, with the erosion rate being lower by up to a factor between ∼5 and 20 for particle test velocities of 148 ms-1 and 63 ms-1 respectively. Films with low residual stress appear to exhibit longer times to failure which tends to occur catastrophically along the coating-substrate interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 555: Symposium OO – Properties and Processing of Vapor-Deposited Coatings , 1998 , 395
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Oles, E. J., Inspektor, A. and Bauer, C. E., Diamond Relat. Mater., 5, (1996), 617.Google Scholar
2. Weihnacht, V., Fan, W. D., Jagannadham, K., Narayan, J. and Liu, C-T, J. Mater. Res., 11, (1996), 2220.Google Scholar
3. Deuerler, F., van den Berg, H., Tabersky, R., Freunlieb, A., Pies, M. and Buck, V., Diamond Relat. Mater., 5, (1996), 1478.Google Scholar
4. Endler, I., Leonhardt, A., Scheibe, H. -J. and Born, R., Diamond Relat. Mater., 5, (1996), 299.Google Scholar
5. Guseva, M. B., Babaev, V. G., Khvostov, V. V., Ludena, G. M. Lopez, Bregadze, A.Yu., Konyashin, I. Y. and Alexenko, A. E., Diamond Relat. Mater., 6, (1997), 89.Google Scholar
6. Amirhaghi, S., Reehal, H. S., Plappert, E., Bajic, Z., Wood, R. J. K. and Wheeler, D. W., presented at 9th European Conference on Diamond, Diamond-like and Related Materials, Crete, September 1998 (accepted for publication in Diamond Relat. Mater.).Google Scholar
7. Wood, R. J. K., BP Report, (1992), unpublished.Google Scholar
8. McHattie, D., Private Communication (1997).Google Scholar
9. Wood, R. J. K. and Wheeler, D. W., (accepted for publication in Wear).Google Scholar
10. Feng, Z., Tzeng, Y, Field, J. E., Thin Solid Films, 212, (1992), 35.Google Scholar
11. Trombetta, J.M., Hoggins, J.T., Klocek, P., McKenna, T.A., Hehn, L.P., Mecholsky, J.J., Window and Dome Technologies and Materials III, Proc. SPIE 1760 (1992), 166–176.Google Scholar