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Grain-Size-Dependent Thermal Transport Properties in Nanocrystalline Yttria-Stabilized Zirconia

Published online by Cambridge University Press:  15 March 2011

Ho-Soon Yang ,
J.A. Eastman ,
L.J. Thompson  and
G.-R. Bai
Ho-Soon Yang
Affiliation:
Argonne National Laboratory, Materials Science Division Argonne, IL 60439
J.A. Eastman
Affiliation:
Argonne National Laboratory, Materials Science Division Argonne, IL 60439
L.J. Thompson
Affiliation:
Argonne National Laboratory, Materials Science Division Argonne, IL 60439
G.-R. Bai
Affiliation:
Argonne National Laboratory, Materials Science Division Argonne, IL 60439
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Abstract

Understanding the role of grain boundaries in controlling heat flow is critical to the success of many envisioned applications of nanocrystalline materials. This study focuses on the effect of grain boundaries on thermal transport behavior in nanocrystalline yttria-stabilized zirconia (YSZ) coatings prepared by metal-organic chemical vapor deposition.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 703: Symposia U/V – Nanophase and Nanocomposite Materials IV , 2001 , V4.7
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

1. Soyez, G., Eastman, J.A., Thompson, L.J., DiMelfi, R.J., Bai, G.-R., Baldo, P.M., McCormick, A.W., Elmustafa, A.A., Tambwe, M.F., and Stone, D.S., Appl. Phys. Lett., 77, no. 8, pp. 1155 (2000).Google Scholar
2. Yang, Ho-Soon, Bai, G.-R., Thompson, L.J., and Eastman, J.A., submitted to Acta Mater. (2001).Google Scholar
3. JCPDS File 30-1468, International Committee for Diffraction Data, Power Diffraction File (Joint Committee on Power Diffraction Standards, Philadelphia, 1977).Google Scholar
4. Wagner, W., Eastman, J. A., Bai, G.-B., and Thompson, L.J., in preparation.Google Scholar
5. Cahill, D. G., Bullen, A., Lee, S.-M., High Temp.-High Press. 32, 135 (2000).Google Scholar
6. Cahill, D. G., Katiyar, M., Ableson, J. R., Phys. Rev. B 50, no. 9, 6077 (1994).Google Scholar
7.Micro Probe Station, MMR Technologies, Inc.Google Scholar
8. Nan, Ce-Wen, Birringer, R., Clarke, D. R., Gleiter, H., J. Appl. Phys. 81, no. 10, 6692 (1997).Google Scholar
9. Swartz, E. T., and Pohl, R. O., Rev. Mod. Phys. 61, 605 (1989).Google Scholar