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Formation of Intensive Photoluminescence in Porous Silicon
Published online by Cambridge University Press: 15 February 2011
Abstract
Photoluminescence (PL) spectra of porous silicon (PS) samples are studied. Effect of mechanical stresses in substrate on PL intensity is shown. The quantum yield (QY) of PS luminescence is estimated by comparing PL spectra of PS and rhodamine 6G.
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- Copyright © Materials Research Society 1996
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