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The Formation and Evolution of InAs 3D Islands on GaAs(001) and a Comparative C-AFM and NC-AFM Study of InAs 3D Islands

Published online by Cambridge University Press:  15 February 2011

T. R. Ramachandran ,
N. P. Kobayashi ,
R. Heitz ,
P. Chen  and
A. Madhukar
T. R. Ramachandran
Affiliation:
Department of Materials Science, University of Southern California, Los Angeles, CA 90089.
N. P. Kobayashi
Affiliation:
Department of Materials Science, University of Southern California, Los Angeles, CA 90089.
R. Heitz
Affiliation:
Department of Materials Science, University of Southern California, Los Angeles, CA 90089.
P. Chen
Affiliation:
Department of Materials Science, University of Southern California, Los Angeles, CA 90089.
A. Madhukar
Affiliation:
Department of Materials Science, University of Southern California, Los Angeles, CA 90089.
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Abstract

The two-dimensional (2D) to three-dimensional (3D) morphology change in the highly strained growth of InAs on GaAs(001) is examined via in-situ, ultra-high vacuum (UHV) scanning tunneling microscopy (STM) and contact-mode atomic force microscopy (C-AFM). The formation of 3D InAs islands (˜2–4nm high) at an InAs delivery, θ˜1.57ML is found to be preceded by the appearance of small quasi-3D clusters (˜0.6–1.2nm high). The 2D to 3D transition is found to occur over a range of θ from ˜1.45ML to 1.74ML, with a varying and gradual mass transfer from 2D to 3D features with increasing θ. The InAs 3D islands are also examined in this study using non-contact AFM (NC-AFM) in order to assess the usefulness of this technique for imaging 3D features. Unlike the constancy observed in the C-AFM images, the NC-AFM images exhibit a marked imaging condition dependence. The variability observed in the NC-AFM images is qualitatively compared to the outcome of the simplest, force-gradient model of NC-AFM in order to extract a guideline for NC-AFM imaging of 3D features.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 440: Symposia CA – Structure and Evolution of Surfaces , 1996 , 31
Copyright
Copyright © Materials Research Society 1997

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