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Film Stress in High Density Thin Film Interconnect

Published online by Cambridge University Press:  21 February 2011

J. Tony Pan  and
Steve Poon
J. Tony Pan
Affiliation:
Microelectronics and Computer Technology Corporation, 12100 Technology Blvd., Austin, TX 78727
Steve Poon
Affiliation:
Microelectronics and Computer Technology Corporation, 12100 Technology Blvd., Austin, TX 78727
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Abstract

High density thin film interconnects are expected to be widely used for multi-chip module application to accommodate next generation high I/O and high speed integrated circuits. These interconnects typically use polyimide as the dielectric, and aluminum or copper (with protective overcoat) as the conductor. The interconnects are typically built on silicon or alumina substrates. Large film stress occurs due to the high processing temperature required to cure polyimide and due to the mismatch in thermal coefficients of expansion (TCE) between the film materials and substrate materials. This work studies film stress for these materials.

An instrument which measures thin film stress in-situ at temperatures between 25 and 450°C was used to characterize the stress in polyimide, nickel, and copper films. Two substrate materials, silicon and sapphire, were used in order to extract the TCE and elastic modulus for each film material. Three polyimide materials were evaluated. One of the polyimides studied showed complete stress relaxation at temperatures above 300°C and was almost completely elastic upon heating and cooling between 25 and 300°C. The TCE was calculated to be 41×10−6/°C and the biaxial elastic modulus was 4.0×109 Pascal. The nickel had very low stress asplated, however, high tensile stress was observed after 350°C annealing as a result of TCE mismatch. After first annealing, the nickel was almost completely elastic upon cooling and repeated heating and cooling between 25 and 350°C. Copper, on the other hand, was not completely elastic under similar thermal treatments. High thermal stress caused plastic deformation to occur in copper films. The room temperature stress in copper film after 350°C annealing depended on yield strength instead of TCE mismatch. The stress in these materials and its effects on processing and reliability for high density interconnect will be reported.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 154: Symposium K – Electronic Packaging Materials Science IV , 1989 , 27
Copyright
Copyright © Materials Research Society 1989

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