Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-25T17:52:55.193Z Has data issue: false hasContentIssue false

Field Emission and Band Bending Considerations From High-Quality NEA Diamond

Published online by Cambridge University Press:  15 February 2011

C. Bandis
Affiliation:
Department of Physics, Washington State University, Pullman, WA 99164–2814
B. B. Pate
Affiliation:
Department of Physics, Washington State University, Pullman, WA 99164–2814
W. Phillips
Affiliation:
Crystallume, 3506 Basset Street, Santa Clara, CA 94054
M. A. Plano
Affiliation:
Crystallume, 3506 Basset Street, Santa Clara, CA 94054
M. D. Moyer
Affiliation:
Crystallume, 3506 Basset Street, Santa Clara, CA 94054
M. A. Moreno
Affiliation:
Crystallume, 3506 Basset Street, Santa Clara, CA 94054
Get access

Abstract

The near band gap photoelectric emission and field emission properties of diamond are investigated. Our results find three characteristic photoelectric yield spectra which have been observed from both polycrystalline CVD diamond films and single crystal diamond. The categories correspond to differences in bulk doping/surface preparation and illustrate the importance of band bending at the surface. Field emission experiments also find that the same three categories have distinct field emission properties. Our field emission observations are discussed in terms of electron transport properties from the bulk to the surface.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Modinos, A., Field, Thermionic, and Secondary Electron Emission Spectroscopy (Plenum, New York, 1984).Google Scholar
2. Pate, B. B., Surf. Sci. 165, 83 (1986).Google Scholar
3. Huang, Z. H. et al., Appl. Phys. Lett. 65, 2562 (1994).Google Scholar
4. Huang, Z. H. et al., J. Vac. Sci. Technol. B 13 (2), 526 (1995).Google Scholar
5. Geis, M. W., Twichell, J. C., and Lyszezrz, T. M., J. Vac. Sci. Technol. B, in press (1996).Google Scholar
6. Xu, N. S., Tseng, Y., and Latham, R. V., J. Phys. D 27, 1988 (1994).Google Scholar
7. Pan, L. S., in Diamond for Electronic Applications, edited by Dreifus, D. et al., MRS Symposia Proceedings, Vol.416 (Materials Research Society, Pittsburgh, 1996), in press.Google Scholar
8. Bandis, C. and Pate, B. B., submitted for publication.Google Scholar
9. Bandis, C. and Pate, B. B., Phys. Rev. B 52 (16), 12056 (1995).Google Scholar
10. Samson, J., Techniques of Vacuum Ultraviolet Spectroscopy (John Wiley, New York, 1967), p. 214.Google Scholar
11. Bandis, C. and Pate, B. B., Phys. Rev. Lett. 74 (5), 777 (1995).Google Scholar
12. Bandis, C., Haggerty, D., and Pate, B. B., in Diamond, SiC and Nitride Wide BandgapSemiconductors, edited by Carter, C. H. Jr., Gildenblat, G., Nakamura, S., and Nemanich, R. J., MRS Symposia Proceedings, Vol.339 (Materials Research Society, Pittsburgh, 1994), p. 75.Google Scholar
13. Bandis, C. and Pate, B. B., unpublished results.Google Scholar
14. Mackey, B. L. et al., Phys. Rev. B 52 (24), R17009 (1995).Google Scholar
15. Bandis, C. and Pate, B. B., Surf. Sci. Lett. 345, L23 (1996).Google Scholar
16. Rhoderick, E. H. and Williams, R. H., Metal-Semiconductor Contacts (Clarendon Press, Oxford, 1988).Google Scholar