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The Fiber Texture Growth and the Surface Roughness of ZNO Thin Films

Published online by Cambridge University Press:  10 February 2011

J. A. Anna Selvan ,
H. Keppner ,
U. Kroll ,
J. Cuperus ,
A. Shah ,
T. Adatte  and
N. Randall
J. A. Anna Selvan
Affiliation:
Institute of Microtechnology, Switzerlandtel.:+41–32 718 3336, +41–32 718 3201, [email protected]
H. Keppner
Affiliation:
Institute of Microtechnology, Switzerlandtel.:+41–32 718 3336, +41–32 718 3201, [email protected]
U. Kroll
Affiliation:
Institute of Microtechnology, Switzerlandtel.:+41–32 718 3336, +41–32 718 3201, [email protected]
J. Cuperus
Affiliation:
Institute of Microtechnology, Switzerlandtel.:+41–32 718 3336, +41–32 718 3201, [email protected]
A. Shah
Affiliation:
Institute of Microtechnology, Switzerlandtel.:+41–32 718 3336, +41–32 718 3201, [email protected]
T. Adatte
Affiliation:
Institute of Geology, University of Neuchâtel, Switzerlandtel.:+41–32 718 3336, +41–32 718 3201, [email protected]
N. Randall
Affiliation:
CSEM instruments, Neuchâtel, Switzerlandtel.:+41–32 718 3336, +41–32 718 3201, [email protected]
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Abstract

Zinc Oxide (ZnO) is one of the important Transparent Conducting Oxides (TCO) for thin film photovoltaic cells with respect to performance and cost reduction. When used in photovoltaic cells, the surface roughness of ZnO is required in order to increase the amount of light going inside the cells (Light Trapping). In this paper we present the surface morphology in connection with the fiber texture of ZnO films at different experimental conditions. The structural properties of the ZnO films grown by the method of radio frequency sputtering and Chemical Vapour Deposition (CVD) with the special effort to make surface roughness (Surface Texturing) are presented. The influence of the control over the fiber texture, surface mobility of the adatoms and the dissociation of water vapour during growth are explained.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 472: Symposium I – Polycrystalline Thin Films - Structure, Texture, Properties..III , 1997 , 39
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1. Deer, W. A., Howie, R. A., Zussman, J., An intro. to the rock forming minerals, (1966), p. 457 Google Scholar
2. Anna Selvan, J. A., Keppner, H. and Shah, A. in Thinfilms for Pholtovoltaics and Relatrd Device Applications. (Mat. Res Soc. Proc. 426, San Francisco, 1996, p. 497–592).Google Scholar
3. Mattman, G., Oswald, H. R. and Schweizer, F. Helvetica Chemica Acta 55, (1972), p. 1249 Google Scholar
4. Fujimura, N., Nishihara, T., Goto, S., Xu, J., Ito, T., J. Cryst. Growth 130 (1993) p. 269–279 Google Scholar
5. Aita, C. R., Purdes, A. J., Lad, R. J. and Funkenbusch, P.D., J. Appl. Phys. 51 (1980) p. 2464 Google Scholar