Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-28T00:05:04.651Z Has data issue: false hasContentIssue false
  • English
  • Français

Far-infrared dielectric function and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P

Published online by Cambridge University Press:  11 February 2011

Tino Hofmann ,
Volker Gottschalch  and
Mathias Schubert
Tino Hofmann
Affiliation:
Solid State Physics Group, Faculty of Physics and Geosciences, University of Leipzig, GERMANY
Volker Gottschalch
Affiliation:
Faculty of Chemistry and Mineralogy, University of Leipzig, GERMANY
Mathias Schubert
Affiliation:
Solid State Physics Group, Faculty of Physics and Geosciences, University of Leipzig, GERMANY
Get access

Abstract

We present a far-infrared spectroscopic ellipsometry study of the phonon properties of partially CuPtB -ordered (AlxGa1-x)0.52In0.48P with x =0, 0.32, 0.7, and 1.0 and degrees of ordering η = 0 … 0.63, determined from generalized ellipsometry measurement of the near-band-gap order birefringence. An anharmonic oscillator approach is used to model the ordinary and extraordinary dielectric functions and determine the infrared-active longitudinal and transversal phonon modes of the thin film samples. Besides the isotropic GaP-, InP- and AlP-like phonon modes, we observe alloy-induced modes with low polarity for η ∼ 0. The evolution of lattice like and alloy-induced modes with increasing η is reviewed for Ga0.52In0.48P. With increasing η all phonon modes split in E- and A1 -type vibrations with polarization perpendicular and parallel to the sublattice ordering direction, respectively, and the mode frequencies shift continuously. Our observations extend recently published phonon frequencies from experiment and theory for CuPt-ordered Ga0.52In0.48P, which are compared and discussed. The phonon modes of highly ordered (AlxGa1-x)0.52In0.48P, η ∼ 0.6, are compared to the modes observed in the highly disordered quaternary solid solution. We propose the far-infrared dielectric anisotropy as a sensitive measure for sublattice ordering in multinary III-V alloys.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 744: Symposium M – Progress in Semiconductors II–Electronic and Optoelectronic Applications , 2002 , M5.33
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Asahi, H., Kawamura, Y., Nagai, H., and Ikegami, T., Inst. Phys. Conf. Ser. 63, 575, (1981).Google Scholar
2. Suzuki, T., Hino, I., Gomyo, , and Nishida, K., Jpn. J. Appl. Phys. 21, L731 (1982).Google Scholar
3. Zunger, A., MRS Bull. 22, 20 (1997).Google Scholar
4. Barker, A. Jr and Sievers, A., Reviews of Modern Physics 47, S1 (1975).Google Scholar
5. Pidgeon, C., in Handbook on Semiconductors, edited by Balkanski, , (North-Holland, Amsterdam, 1980), Vol. 2, pp. 223–328.Google Scholar
6. Gervais, F. and Piriou, B., J. Phys. C 7, 2374 (1974).Google Scholar
7. Berreman, D. and Unterwald, F., Phys. Rev. 174, 791 (1968).Google Scholar
8. Kasic, A, Schubert, M., Einfeld, S., Hommel, D., and Tiwald, T., Phys. Rev. B 62, 7365 (2000).Google Scholar
9. Kasic, A., Schubert, M., Kuhn, B., Scholz, F., Einfeldt, S., and Hommel, D., J. Appl. Phys. 87, 3720 (2001).Google Scholar
10. Azzam, R. M. A. and Bashara, N. M., Ellipsometry and polarized light, North-Holland, Amsterdam, 1984.Google Scholar
11. Jellison, E., Thin Solid Films 313/314, 33 (1998).Google Scholar
12. Schubert, M., Hofmann, T., Rheinländer, B., Pietzonka, I., Saβ, T., Gottschalch, V., and Woollam, J.A., Phys. Rev. B 60, 16618 (1999 Google Scholar
13. Hofmann, T., Gottschalch, V., Schubert, M., Phys. Rev. B 66, 195204 (2002).Google Scholar
14. Ozoliņš, V. and Zunger, A., Phys. Rev. B 63, 087202 (2001).Google Scholar
15. Ozoliņš, V. and Zunger, A., Phys. Rev. B 57, R9404 (1998).Google Scholar
16. Hofmann, T., Leibiger, G., Gottschalch, V., Pietzonka, I., and Schubert, M., Phys. Rev. B 64, 155206 (2001).Google Scholar