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Fano Factor Determination For CZT

Published online by Cambridge University Press:  10 February 2011

R. H. Redus ,
J. A. Pantazis ,
A. C. Huber ,
V. T. Jordanov ,
J. F. Butler  and
B. Apotovsky
R. H. Redus
Affiliation:
Amptek, Inc, 6 De Angelo Dr., Bedford MA
J. A. Pantazis
Affiliation:
Amptek, Inc, 6 De Angelo Dr., Bedford MA
A. C. Huber
Affiliation:
Amptek, Inc, 6 De Angelo Dr., Bedford MA
V. T. Jordanov
Affiliation:
Amptek, Inc, 6 De Angelo Dr., Bedford MA
J. F. Butler
Affiliation:
Digirad, San Diego CA
B. Apotovsky
Affiliation:
Digirad, San Diego CA
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Abstract

Continued improvements in the manufacturing of Cd1−xZnxTe (CZT) material have resulted in a practical thermoelectrically cooled X-ray and gamma-ray detector of very high energy resolution. A high resolution spectroscopy system was used to measure the Fano factor in CZT at temperatures down to -40°C. The best resolution of the 5.9 keV 55Fe peak was measured to be 188 eV FWHM, while the best resolution of the 59.5 keV 241Am peak was measured to be 482 eV FWHM. The minimum measured Fano factor was 0.082, with several measurements yielding a value of 0.089±0.005. With a resolution of 4.2 keV FWHM for the 662 keV peak of 137Cs, these detectors demonstrate excellent performance in detecting X-rays and gamma rays.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 101
Copyright
Copyright © Materials Research Society 1998

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