Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-29T07:48:23.400Z Has data issue: false hasContentIssue false

Fabrication of polycrystalline thin films of liquid crystalline materials by solution process and its application to OFETs

Published online by Cambridge University Press:  01 February 2011

Hiroaki Iino
Affiliation:
[email protected], Tokyo Institute of Technology, Imaging Science & Engineering Laboratory, 4259 Nagatsuta, Midori-ku, Yokohama, 226-8503, Japan
Jun-ichi Hanna
Affiliation:
[email protected], Tokyo Institute of Technology, Imaging Science & Engineering Laboratory, 4259 Nagatsuta, Midori-ku, Yokohama, 226-8503, Japan
Get access

Abstract

We have fabricated polycrystalline OFETs of two different liquid crystalline materials i.e., ω,ω'-dihexylquaterthipohene (6-QTP-6) and N, N'-ditridecylperylenediimide (13-Per-13) by solution process. Liquid crystalline materials help fabricating uniform thin films on the substrate when spin-coated at their temperature range of liquid crystalline phase. The FETs fabricated with 6-QTP-6 exhibited p-channel performance and its mobility was determined to be 0.04 cm2/Vs, which was comparable to that determined by time-of-flight experiments. The FETs fabricated with 13-Per-13 exhibited n-channel performance and its FET mobility was 0.008 cm2/Vs, while the mobility was increased up to 0.11 cm2/Vs after thermal annealing of the film at a liquid crystalline temperature of 220°C for an hour. Judging from these facts, the grain boundaries are controlled not so as to across the conduction channels formed by self-aligned π-conjugated aromatic cores in liquid crystalline molecules. We conclude that liquid crystalline material is a good candidate for quality polycrystalline thin films for OFETs.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Nelson, S. F., Lin, Y.Y., Gundlach, D. J., and Jackson, T. N., Appl. Phys. Lett. 72, 1854 (1998).Google Scholar
[2] Garnier, F., Horowitz, G., Peng, X., and Fichou, D., Adv. Mater. 2, 592 (1990).Google Scholar
[3] Iino, H. and Hanna, J., Jpn. J. Appl. Phys. 45, L870 (2006).Google Scholar
[4] Azumi, R., Götz, G., and Bäuerle, P., Syn. Mettals 101, 544 (1999).Google Scholar