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Fabrication of CDS Thin Films Using Continuous Wave Laser Evaporation

Published online by Cambridge University Press:  15 February 2011

E.W. Tenpas
Affiliation:
Alfred University, Department of Electrical Engineering, Alfred New York 14802
K. D. Vuong
Affiliation:
Alfred University, Department of Electrical Engineering, Alfred New York 14802
S. Orloff
Affiliation:
Alfred University, Department of Electrical Engineering, Alfred New York 14802
J.G. Fagan
Affiliation:
Alfred University, Department of Electrical Engineering, Alfred New York 14802
V. Wu
Affiliation:
Alfred University, Department of Electrical Engineering, Alfred New York 14802
X.W. Wang
Affiliation:
Alfred University, Department of Electrical Engineering, Alfred New York 14802
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Abstract

We report new results on continuous wave Nd: YAG laser deposition of Cadmium Sulfide (CdS) thin films. Substrates were soda-lime silicate (SLS) glass, silica glass, silicon, alumina, and copper coated formvar sheets. As-deposited films were characteristically mixtures of cubic and hexagonal phases. X-ray diffraction analysis reveals that two different grain size groups are present. As revealed by SEM micrographs, films had smooth surface morphology. Transmission electron microscopy analysis reveals that grain sizes were extremely small. Also, semiconductive behavior was noted.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

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