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Fabrication of Biaxially Oriented YBCO on (00l) Biaxially Oriented Yttria-Stabilized-Zirconia on Polycrystalline Substrates

Published online by Cambridge University Press:  15 February 2011

Paul Arendt ,
Steve Foltyn ,
Xin Di Wu ,
John Townsend ,
Chris Adams ,
Marilyn Hawley ,
Prabhat Tiwari ,
Martin Maley ,
Jeffrey Willis  and
David Moseley
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Paul Arendt
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
Steve Foltyn
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
Xin Di Wu
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
John Townsend
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
Chris Adams
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
Marilyn Hawley
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
Prabhat Tiwari
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
Martin Maley
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
Jeffrey Willis
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
David Moseley
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
Yates Coulter
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87544
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Abstract

Ion-assisted, ion-beam sputter deposition is used to obtain (00l) biaxially oriented films of cubic yttria-stabilized-zirconia (YSZ) on polycrystalline metal substrates. Yttrium-barium-copper-oxide (YBCO) is then heteroepitaxially-pulse-laser deposited onto the YSZ. Phi scans of the films show the full-width-half maxima of the YSZ (202) and the YBCO (103) reflections to be 14° and 10° respectively. Our best dc transport critical current density measurement for the YBCO is 800,000 A/cm2 at 75K and 0T. At 75K, the total dc transport current in a 1 cm wide YBCO film is 23 A.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 341: Symposium F – Epitaxial Oxide Thin Films and Heterostructures , 1994 , 209
Copyright
Copyright © Materials Research Society 1994

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