Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T02:00:45.977Z Has data issue: false hasContentIssue false
  • English
  • Français

Extending AFM Phase Image of Nanocomposite Structures to 3D using FIB

Published online by Cambridge University Press:  27 February 2012

Russell J. Bailey ,
Remco Geurts ,
Debbie J. Stokes ,
Frank de Jong  and
Asa H. Barber
Russell J. Bailey
Affiliation:
Department of Materials, School of Engineering & Materials Science, Queen Mary University of London, London E1 4NS United Kingdom.
Remco Geurts
Affiliation:
FEI Company, 5651 GG Eindhoven, Netherlands.
Debbie J. Stokes
Affiliation:
FEI Company, 5651 GG Eindhoven, Netherlands.
Frank de Jong
Affiliation:
FEI Company, 5651 GG Eindhoven, Netherlands.
Asa H. Barber
Affiliation:
Department of Materials, School of Engineering & Materials Science, Queen Mary University of London, London E1 4NS United Kingdom.
Get access

Abstract

The mechanical behavior of nanocomposites is critically dependent on their structural composition. In this paper we use Focused Ion Beam (FIB) microscopy to prepare surfaces from a layered polymer nanocomposite for investigation using phase contrast atomic force microscopy (AFM). Phase contrast AFM provides mechanical information on the surface examined and, by combining with the sequential cross-sectioning of FIB, can extend the phase contract AFM into three dimensions.

Keywords

scanning probe microscopy (SPM)nanostructurecomposite
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1421: Symposium PP – Three-Dimensional Tomography of Materials , 2012 , mrsf11-1421-pp07-09
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Zhang, J.M., Reynolds, C.T. and Peijs, T., Compos Part A-Appl S 40, 1747 (2009).Google Scholar
2. Barber, A. H., Andrews, R., Schadler, L. S. Appl. Phys. Lett. 87, 203106 (2005).Google Scholar
3. Wang, W., Ciselli, P., Kuznetsov, E., Peijs, T., Barber, A. H. Phil. Trans. R. Soc. A 366, 1613 (2008).Google Scholar
4. Wang, W., Bushby, A. J., Barber, A. H. Appl. Phys. Lett. 93, 201907 (2008).Google Scholar
5. Wang, W., Peijs, T., Barber, A. H. Nanotechnology 21, 035707 (2010).Google Scholar
6. D’Amato, M.J., Marcus, M.S., Eriksson, M.A. and Carpick, R.W., Appl. Phys. Lett. 85, 4738 (2007).Google Scholar
7. Orloff, J., Utlaut, M.W. and Swanson, L., “High Resolution Focused Ion Beams: FIB and its Applications”, New York; London: Kluwer Academic/Plenum. (2003)Google Scholar
8. Giannuzzi, L.A. and Stevie, F.A., Micron 30, 197 (1999).Google Scholar
9. Stokes, D.J., Morrissey, F. and Lich, B. H., J. Phys.: Conf. Ser. 26, 50 (2006).Google Scholar