Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-25T17:56:10.049Z Has data issue: false hasContentIssue false

Experiment and Modeling of Conversion of Substrate-Waveguided Modes to Surface-Emitted Light by Substrate Patterning

Published online by Cambridge University Press:  14 March 2011

Min-Hao M. Lu
Affiliation:
Center for Photonic and Optoelectronic Materials, Department of Electrical Engineering, Princeton University, Princeton, NJ 08544, U.S.A.
Conor F. Madigan
Affiliation:
Center for Photonic and Optoelectronic Materials, Department of Electrical Engineering, Princeton University, Princeton, NJ 08544, U.S.A.
J. C. Sturm
Affiliation:
Center for Photonic and Optoelectronic Materials, Department of Electrical Engineering, Princeton University, Princeton, NJ 08544, U.S.A.
Get access

Abstract

To predict the optical power that could be harvested from light emission that is waveguided in the substrate of organic light emitting devices (OLEDs), a quantitative quantum mechanical model of the light emitted into the waveguided modes has been developed. The model was used to compute the exact distribution of energy in external, substrate and ITO/organic modes as a function of the distance of the emission zone from the cathode. The results are compared to the classical ray optics model and to experiments in two-layer OLED devices. Classical ray optics is found to substantially over-predict the light in waveguided modes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Gu, G., Garbuzov, D. Z., Burrows, P. E., Venkatesh, S., and Forrest, S. R., Opt. Lett., 22, 396 (1997).Google Scholar
2. Yamasaki, T., Sumioka, K., and Tsutsui, T., App. Phys. Lett., 76, 1243, (2000).Google Scholar
3. Madigan, C., Lu, M.-H., Sturm, J. C., App. Phys. Lett., 76, 1650 (2000).Google Scholar
4. Ujihara, K., Phys. Rev. A, 12, 148 (1975).Google Scholar
5. Bulovic, V., Khalfin, V. B., Gu, G., and Burrows, P. E., Garbuzov, D. Z., and Forrest, S. R., Phys. Rev. B, 58, 3730 (1998).Google Scholar
6. Chance, R. R., Prock, A., and Sibley, R., Adv. in Chem. Phys., 37, 1 (1978).Google Scholar
7. Garbuzov, D. Z., Bulovic, V., Burrows, P. E., and Forrest, S. R., Chem. Phys. Lett., 249, 433 (1996).Google Scholar
8. Wu, C.-C., Sturm, J. C., Register, R. A., Tian, J., Dana, E. P., and Thomson, M. E., IEEE Tran. Elec. Dev., 44, 1269 (1997).Google Scholar