No CrossRef data available.
Article contents
Exafs Studies of Multilayer Interfaces
Published online by Cambridge University Press: 21 February 2011
Abstract
Important for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni- Ti multilayers.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1989