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EXAFS and Raman Studies of PTMGn:MCl2 and PTMG/PEGn:MCl2 Complexes (M = Co, Zn)

Published online by Cambridge University Press:  10 February 2011

C.A. Furtado ,
A.O. Porto ,
G.G. Silva ,
R.A. Silva ,
M.C. Martins Alves ,
P.J. Schilling  and
R. Tittsworth
C.A. Furtado
Affiliation:
Centro de Desenvolvimento da Tecnologia Nuclear - CDTN/CNEN, C.P. 941, 30123-970, Belo Horizonte, MG, Brazil, [email protected]
A.O. Porto
Affiliation:
Instituto de Ciências Exatas, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil
G.G. Silva
Affiliation:
Instituto de Ciências Exatas, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil
R.A. Silva
Affiliation:
Instituto de Ciências Exatas, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil
M.C. Martins Alves
Affiliation:
Laboratório Nacional de Luz Síncrotron - LNLS, Campinas, SP, Brazil
P.J. Schilling
Affiliation:
Center for Advanced Microstructures and Devices - CAMD, Louisiana State University, Baton Rouge, LA, USA
R. Tittsworth
Affiliation:
Center for Advanced Microstructures and Devices - CAMD, Louisiana State University, Baton Rouge, LA, USA
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Abstract

Extended x-ray absorption fine structure (EXAFS) and Raman spectroscopy measurements have been performed in a series of liquid polymer electrolytes prepared using poly(tetramethylene glycol) (PTMG), and copolymer poly(tetramethylene glycol/poly(ethylene glycol) (PTMG/PEG), as matrices, and ZnCl2or COCl2 as dopants in the concentration range of n = 30 to 90, where n is the molar ratio of Oxigen/Metal cation. EXAFS results have shown the presence of Co-O and Co-Cl coordination shells for PTMG/CoCl2 and PTMG/PEG/CoCl2 systems. Zn-based systems have shown only Zn-Cl bonds in all the concentration range studied. The presence of ZnCl2 and COCl2 species was confirmed by Raman measurements, by the presence of bands characteristic of CI-Zn-Cl and Co-Cl stretching modes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 45
Copyright
Copyright © Materials Research Society 2000

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References

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