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Estimation Of Complex Permittivity Of Printed Circuit Board Material Using Waveguide Measurements

Published online by Cambridge University Press:  10 February 2011

C. J. Reddy ,
M. D. Deshpande  and
G. A. Hanidu
C. J. Reddy
Affiliation:
Department of Electrical Engineering, Hampton University, Hampton VA 23668
M. D. Deshpande
Affiliation:
ViGYAN Inc., Hampton VA 23681
G. A. Hanidu
Affiliation:
Department of Electrical Engineering, Hampton University, Hampton VA 23668
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Abstract

A simple waveguide measurement technique is presented to determine the complex permittivity of printed circuit board material. The printed circuit board with metal coating removed from both sides and cut into size which is the same as the cross section of the waveguide is loaded in a short X-band rectangular waveguide. Using a network analyzer, the reflection coefficient of the shorted waveguide(loaded with the sample) is measured. Using the Finite Element Method(FEM) the exact reflection coefficient of the shorted wavguide(loaded with the sample) is determined as a function of dielectric constant. Matching the measured value of the reflection coefficient with the reflection value calculated using FEM and utilizing Newton-Raphson Method, an estimate of the dielectric constant of a printed circuit board material is obtained. A comparison of estimated values of permittivity constant obtained using the present approach with the available data.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 430: Symposium O – Microwave Processing of Materials V , 1996 , 301
Copyright
Copyright © Materials Research Society 1996

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References

[1] Baker-Jarvis, James, Dielectric and magnetic measurement methods in transmission lines: an overview. (Proceedings of the 1992 AMTA Workshop, 1992).Google Scholar
[2] Ligthart, Leo P., IEEE Trans. on MTT, 31, 249–254 (1983).Google Scholar
[3] Press, W. H., Numerical recipes, The art of scientific computing (Fortran version), (Cambridge University Press, Cambridge, 1989) Chap. 9.Google Scholar
[4] Cravey, R. L et al, NASA TM 110147, April 1995.Google Scholar
[5] Dielectric material measurement forum, (Hewlett Packard, 1993).Google Scholar
[6] Harrington, R. F., Time-harmonic electromagnetic fields, (McGraw-Hill Book Company, New York, 1961).Google Scholar
[7] Reddy, C. J., Deshpande, M.D., Cockrell, C.R. and Beck, F.B., NASA TP 3485, December 1994.Google Scholar
[8] Deshpande, M. D., Reddy, C. J., NASA CR 198203, August 1995.Google Scholar