Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-20T01:00:13.303Z Has data issue: false hasContentIssue false

Epitaxy, Oxidation and Surface Structure of Copper on Gold Films by High Resolution Electron Microscopy

Published online by Cambridge University Press:  25 February 2011

William Krakow
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598 USA
Victor Cast˜no
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598 USA
Get access

Abstract

High resolution electron microscope studies were undertaken of the epitaxy and oxidation of thin layers (<30Å) of vapor deposited Cu on single crystal Au films. The metal/metal and oxide/metal orientation relationships were analyzed for both the diffraction and imaging modes, before and after the Cu oxidation was significant. For the oxide overlayers two cases were studied: (111) Cu which transforms into three (110) variants of Cu2O, each rotated by 120° and (110) Cu transforming to a layered (211) oxide overgrowth. A lateral displacement of the surface top layer of Cu atoms was found for the (110) orientation of Cu2O. The (211) orientation of Cu2O had two structural variants of surface ordering rotated by 90° relative to the underlying metal. One of these cases directly exhibits a 3.01Å × 7.39Å supercell structure characteristic of a 0.58Å atomic step height of the (211) planar layers perpendicular to the surface.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Cherns, D., Phil. Mag. 30, 549 (1974).Google Scholar
2. Krakow, W., Sur. Sci. 111, 503 (1981).Google Scholar
3. Krakow, W., Thin Solid Films 93, 235 (1982).Google Scholar
4. Yagi, K., Takayanagi, K., Kobayashi, K., Osakabe, N. and Honjo, G., Sur. Sci. 86, 174 (1979).Google Scholar
5. Takayanagi, K., Sur. Sci. 104, 527 (1981).Google Scholar
6. Tanishiro, Y., Kanamori, H., Takayanagi, K., Yagi, K. and Honjo, G., Sur. Sci. 111, 395 (1981).CrossRefGoogle Scholar
7. Marks, L.D. and Smith, D.J., Nature 26, 316 (1983), and Sur. Sci. 143, 495 (1984).Google Scholar
8. Krakow, W. and Castãno, V., Mat. Res. Sci. Symp. on Physical and Chemical Properties of Thin Metal Overlayers and Alloy Surfaces, (Mat. Res. Soc., 1986 Fall Meeting), in press.Google Scholar
9. Krakow, W., Sur. Sci. 140, 137 (1984).Google Scholar
10. Krakow, W., Mat. Res. Sci. Symp. Proc. 31, (Elsevier Sci. Pub. Co., Inc., (1984)), p. 189.Google Scholar
11. Krakow, W., Proc. 42nd Ann. EMSA Meeting, (San Francisco Press, (1984)), p. 656.Google Scholar
12. Lawless, K.L. and Gwathmey, A.T., Acta Met. 4, 153 (1956).CrossRefGoogle Scholar
13. Guan, R., Hashimoto, H. and Yoshida, T., Acta Cryst. B40, 109 (1984).Google Scholar
14. Guan, R. Hashimoto, H. and Kuo, K.H., Acta Cryst. B40, 560 (1984).Google Scholar
15. Kuo, K.H., Jeol News 22E, No. 3, 11 (1985).Google Scholar
16. Simmons, G.W., Mitchell, D.F. and Lawless, K.R., Proc. The Structure of Surfaces, (North Holland, 1967), edited by Dans, H.M. and Lawless, K.R., p. 130.Google Scholar
17. Bauer, E. and Poppa, H., Thin Solid Films 12, 167 (1972).Google Scholar