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Epitaxial Praseodymium Oxide: A New High-K Dielectric

Published online by Cambridge University Press:  11 February 2011

H. J. Osten ,
E. Bugiel  and
A. Fissel
H. J. Osten
Affiliation:
Institute for Semiconductor Devices and Electronic Materials, University of Hannover, Appelstr. 11A, D-30167 Hannover, Germany
E. Bugiel
Affiliation:
Institute for Semiconductor Devices and Electronic Materials, University of Hannover, Appelstr. 11A, D-30167 Hannover, Germany
A. Fissel
Affiliation:
Institute for Semiconductor Devices and Electronic Materials, University of Hannover, Appelstr. 11A, D-30167 Hannover, Germany Information Technology Laboratory, University of Hannover, Schneiderberg 32, D-30167 Hannover, Germany
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Abstract

We show results for molecular beam epitaxial (MBE) growth of praseodymium oxide on Si. On Si(100) oriented surfaces, crystalline Pr2O3 grows as (110)-domains, with two orthogonal in-plane orientations. Epitaxial overgrowth with Si could not been realized so far. We obtain perfect epitaxial growth of hexagonal Pr2O3 on Si(111). These layers can also be overgrown epitaxially with Si leading to novel tunnel structures. Crystalline Pr2O3 on Si(OOl) is a promising candidate for highly scaled gate insulators, displaying sufficiently high-K value of around 30, ultra-low leakage current density, good reliability, and high electrical breakdown voltage. The Pr2O3/Si(001) interface exhibits the symmetric band alignment, desired for applying such material in both n- and p-type devices. The valence band as well as the conduction band offset to Si is above 1 eV. The electron masses can be assumed to be very heavy in the oxide. This effect together with the suitable band offsets leads to the unusually low leakage currents found experimentally. Finally, the integration of crystalline Pr2O3 high-K gate dielectrics into a conventional CMOS process will be demonstrated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 744: Symposium M – Progress in Semiconductors II–Electronic and Optoelectronic Applications , 2002 , M1.5
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

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