Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Low, B L
Xu, S Y
Ong, C K
Wang, X B
and
Shen, Z X
1997.
Substrate temperature dependence of the texture quality in YBCO thin films fabricated by on-axis pulsed-laser ablation.
Superconductor Science and Technology,
Vol. 10,
Issue. 1,
p.
41.
Wisotzki, Elmar
Balogh, Adam G.
Hahn, Horst
Wolan, John T.
and
Hoflund, Gar B.
1999.
Room-temperature growth of ZrO2 thin films using a novel hyperthermal oxygen-atom source.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 17,
Issue. 1,
p.
14.
Bhalla, A.S.
Guo, Ruyan
and
Roy, Rustum
2000.
The perovskite structure—a review of its role in ceramic science and technology.
Materials Research Innovations,
Vol. 4,
Issue. 1,
p.
3.
Bae, Seung-Young
Choi, Hyun-Seok
Choi, Se-Young
and
Oh, Young-Jei
2000.
Sol–gel processing for epitaxial growth of ZrO2 thin films on Si(100) wafers.
Ceramics International,
Vol. 26,
Issue. 2,
p.
213.
Migita, S.
and
Sakai, S.
2001.
Epitaxial structure SrTiO3〈011〉 on Si〈001〉.
Journal of Applied Physics,
Vol. 89,
Issue. 10,
p.
5421.
Migita, Shinji
Sakamaki, Kazuo
Xiong, Si Bei
Ota, Hiroyuki
Tarui, Yasuo
and
Sakai, Shigeki
2004.
Fabrication and electrical properties of ferroelectric‐gate FETS with epitaxial gate structures.
Electronics and Communications in Japan (Part II: Electronics),
Vol. 87,
Issue. 1,
p.
24.
Machlin, E.S.
2006.
Materials Science in Microelectronics II.
p.
1.