Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-29T07:32:38.449Z Has data issue: false hasContentIssue false

Energy Dispersive X-ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis

Published online by Cambridge University Press:  10 February 2011

Dale Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8371
David Wollman
Affiliation:
National Institute of Standards and Technology, Boulder, CO 80303
Kent Irwin
Affiliation:
National Institute of Standards and Technology, Boulder, CO 80303
Gene Hilton
Affiliation:
National Institute of Standards and Technology, Boulder, CO 80303
John Martinis
Affiliation:
National Institute of Standards and Technology, Boulder, CO 80303
Get access

Abstract

The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D.C., Romig, A. D. Jr, Lyman, C. E., Fiori, C., and Lifshin, E., Scanning Electron Microscopy and X-ray Microanalysis, 2nd edition (Plenum Press, New York, 1992).Google Scholar
2.Wollman, D. A., Irwin, K. D., Hilton, G. C., Dulcie, L. L., Newbury, D. E., and Martinis, J. M., “High-resolution, energy-dispersive microcalorimeter spectrometer for X-ray microanalysis”, J. Micros., 188, (1997) 196223.Google Scholar