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Electro-Optics, Photoconductivity and the Photorefractive Effect

Published online by Cambridge University Press:  21 February 2011

K. W. Goossen ,
N. M. Haegel  and
D. D. Nolte
K. W. Goossen
Affiliation:
AT&T Bell Labs
N. M. Haegel
Affiliation:
Dept. of Materials Science UCLA
D. D. Nolte
Affiliation:
Dept. of Physics Purdue University
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Extract

This symposium was established as an interdisciplinary forum to foster lines of communications among three separate research communities. These communities are: 1) the electro-optic community, 2) the photorefractive community, and 3) the photodetector community. In each of these fields microscopic electric fields are generated inside semiconductor materials by illumination.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 261: Symposium D – Photo-Induced Space Charge Effects in Semiconductors: Electro-Optics, Photoconductivity and the Photorefractive Effect , 1992 , 3
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

(1) Miller, D. A. B., Opt. and Quant. Electron. 22, S61 (1990)Google Scholar
(2) Lentine, A. L., Hinton, H. S., Miller, D. A. B., Henry, J. E., Cunningham, J. E., and Chirovsky, L. M. F., IEEE J. Quant. Electron. 25, 1928 (1989)Google Scholar
(3) Goossen, K. W., Cunningham, J. E., and Jan, W. Y., Appl. Phys. Lett. 57, 2582 (1990)CrossRefGoogle Scholar
(4) Lampert, M.A. and Mark, P., Current Injection in Solids (Academic Press, New York 1970).Google Scholar
(5) Haegel, N. M., Appl. Phys. A 53, 1 (1991)Google Scholar
(6) Williams, R., J. Appl. Phys. 40,184 (1969)Google Scholar
(7) Haegel, N. M., Latasa, C. A. and White, A. M., MRS Proc. Vol 261, 1992 Google Scholar
(8) Henisch, H. K., Semiconductor Contacts: An Approach to Ideas and Models (Oxford Press, Oxford 1984)Google Scholar
(9) Ralph, S. E. and Grischkowski, D., Appl. Phys. Lett. 59, 1972 (1991)Google Scholar
(10) Petroff, M. D. and Stapelbroek, M. G., Infrared Information Symposium: Specialty Group on Infrared Detectors (1980, 1984 and 1985)Google Scholar
(11) Szmulowicz, F. and Madarsz, F. L., J. Appl. Phys. 62, 2533 (1987)Google Scholar
(12) Petroff, M. D., Stapelbroek, M. G. and Kleinhaus, W. A., Appl. Phys. Lett. 51, 406 (1987)Google Scholar
(13) Günter, P. and Huignard, J. -P., eds. Photorefractive Materials and Their Applications (Springer Verlag, Berlin, 1988)Google Scholar
(14) Nolte, D. D. and Glass, A. M., Opt. and Quant. Electron. 22, S47 (1990)Google Scholar
(15) Picoli, G., Gravey, P., Ozkul, C. and Vieux, V., J. Appl. Phys. 66, 3798 (1989)Google Scholar
(16) Nolte, D. D., Olson, D. H. and Glass, A. M., Appl. Phys. Lett. 56,163 (1990)Google Scholar
(17) Nolte, D. D., Olson, D. H., Doran, G. E., Knox, W. H. and Glass, A. M., J. Opt. Soc. of America B7, 2217 (1990)Google Scholar
(18) Partovi, A., Glass, A. M., Olson, D. H., Zydzik, G. J., Short, K. T., Feldman, R. D., Austin, R. F., Appl. Phys. Lett. 59,1832 (1991)Google Scholar
(19) Kukhtarev, N. V., Markov, V. B., Odulov, S. G., Soskin, M. S. and Vinetskii, V. L., Ferroelectrics 22, 949 (1979)Google Scholar
(21) Imbert, B., Rajbenbach, H., Mallick, S., Herriau, J. P., and Huignard, J. P., Opt. Lett. 13, 327 (1988)Google Scholar
(22) Stepanov, S. I. and Petrov, M. P., Opt. Commun. 53, 292 (1985)Google Scholar