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Electron Energy-Loss Spectroscopy in a 400kV Transmission Electron Microscope (TEELS)
Published online by Cambridge University Press: 25 February 2011
Abstract
Electron energy-loss spectroscopy in the transmission electron microscopy (TEELS) is a powerful technique to investigate the “electron and atom interaction in specimen microareas”.
This paper reports some experimental data of TEELS concerning specimen thickness effect and advantages of 400 kV TEM, and introduces newly developed digital processing of EELS spectra, which is a powerful technique to get the information from the specimen materials.
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- Copyright © Materials Research Society 1986