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Electron Emission Mechanism of Doped CVD Diamond Characterized Using Combined XPS/UPS/FES System

Published online by Cambridge University Press:  01 February 2011

Hisato Yamaguchi
Affiliation:
[email protected], Japan Advanced Institute of Science and Technology, School of Materials science, 1-1 Asashidai, Nomi, 923-1292, Japan
Ichitaro Saito
Affiliation:
[email protected], University of Cambridge, Department of Engineering, 9, JJ Thompson Avenue, Cambridge, CB3 0FA, United Kingdom
Yuki Kudo
Affiliation:
[email protected], International Christian University, Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 181-8585, Japan
Tomoaki Masuzawa
Affiliation:
[email protected], International Christian University, Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 181-8585, Japan
Takatoshi Yamada
Affiliation:
[email protected], AIST, Diamond Research Center, 1-1-1 Umezono, Tsukuba, 305-8568, Japan
Masato Kudo
Affiliation:
[email protected], JEOL, Technical Division 1, 3-1-2 Musashino, Akishima, Tokyo, 196-8558, Japan
Yuji Takakuwa
Affiliation:
[email protected], Tohoku University, IMRAM, 2-1-1 Katahira, Aoba, Sendai, 980-8577, Japan
Ken Okano
Affiliation:
[email protected], International Christian University, Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 181-8585, Japan
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Abstract

Electric field of less than 5 V/μm is enough to extract electrons from diamond, whereas field of one to two orders of magnitude higher is needed to extract electrons from metal emitter tips. Despite such low-threshold field, the difficulty in clarification of electron emission mechanism is the factor preventing diamond from being used in a practical use. Quite a few numbers of possible mechanisms were proposed to better understand the origin and properties of the observed emission. Most of these mechanisms were, however, based on the conventional I (Emission current)-V (Anode voltage) characteristics. Energy distribution of the field-emitted electrons is essential in direct clarification of the mechanism. In this study, combined XPS/UPS/FES system was used to characterize the electron emission mechanism of doped chemical vapor deposited (CVD) diamond. The results indicated successful observation of the origin of field-emitted electrons from doped CVD diamond comparison with natural diamond, used as a reference.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

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