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Electroluminescence of Cu(In,Ga)Se2 solar cells and modules

Published online by Cambridge University Press:  21 August 2013

U. Rau ,
T. C. M. Müller ,
T. M. H. Tran ,
B. E. Pieters  and
A. Gerber
U. Rau
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich, 52425 Jülich, Germany
T. C. M. Müller
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich, 52425 Jülich, Germany
T. M. H. Tran
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich, 52425 Jülich, Germany
B. E. Pieters
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich, 52425 Jülich, Germany
A. Gerber
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich, 52425 Jülich, Germany
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Abstract

Fundamental aspects of (electro-)luminescence of Cu(In,Ga)Se2 solar cells and modules are investigated by means of spectrally and spatially resolved measurements. The validity of the reciprocity relation between spectrally resolved electroluminescence emission and photovoltaic quantum efficiency is verified for the case of industrially produced ZnO/CdS/Cu(In,Ga)Se2 heterojunction solar cells. Further we find that photo- and electroluminescent emission in these devices obey a superposition principle only in a limited range of the applied electrical or illumination bias. This range depends on the light soaking history of the sample and extends up to an injected current density of approximately 15 mAcm-2 after 3 h of light soaking at a temperature of 400 K. In the state prior to light soaking this range is limited to 4 mAcm-2. At higher bias, a characteristic discrepancy between electroluminescence and electro-modulated photoluminescence appears. We attribute this anomaly to a potential barrier behavior close to the CdS/ Cu(In,Ga)Se2 interface. Metastable defect reactions induced by holes injected into the space charge region partly reduce this barrier. We further find that the luminescence efficiency is enhanced by a factor of 3 by light soaking at 400 K. Spatially resolved electroluminescence measurements conducted during application of voltage or current bias at ambient temperature in the dark are qualitatively compatible with the conclusions drawn from the spectrally resolved measurements.

Keywords

luminescencedefectsphotovoltaic
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1538: Symposium C – Compound Semiconductors: Thin-Film Photovoltaics, LEDs and Smart Energy Controls , 2013 , pp. 133 - 144
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Fuyuki, T., Kondo, H., Yamazaki, T., Takahashi, Y., and Uraoka, Y., Appl. Phys. Lett. 86, 262108 (2005).CrossRefGoogle Scholar
Helbig, A., Kirchartz, T., Schaeffler, R., Werner, J. H., and Rau, U., Sol. Ener. Mater. & Sol. Cells 94, 979 (2010).CrossRefGoogle Scholar
Brown, G., Pudov, A., Cardozo, B., Faifer, V., Bykov, E., and Contreras, M., J. Appl. Phys. 108, 074516 (2010).CrossRefGoogle Scholar
Johnston, S., Unold, T., Repins, I., Sundaramoorthy, R., Jones, K. M., To, B., Call, N., and Ahrenkiel, R., J. Vac. Sci. & Techn. A 28, 665 (2010).CrossRefGoogle Scholar
Paire, M., Lombez, L., Guillemoles, J.-F., and Lincot, D., Thin Solid Films 519, 7493 (2011).CrossRefGoogle Scholar
Rau, U., Phys. Rev. B 76, 085303 (2007).CrossRefGoogle Scholar
Rau, U., IEEE J. Photov. 2, 1697 (2012).CrossRefGoogle Scholar
Ramspeck, K., Bothe, K., Hinken, D., Fischer, B., Schmidt, J., and Brendel, R., Appl. Phys. Lett. 90, 153502 (2007).CrossRefGoogle Scholar
Würfel, P., Trupke, T., Puzzer, T., Schäffer, E., Warta, W., and Glunz, S. W., J. Appl. Phys. 101, 123110 (2007).CrossRefGoogle Scholar
Kirchartz, T., Rau, U., Kurth, M.. Mattheis, J., and Werner, J. H., Thin Solid Films 515, 6238 (2007).CrossRefGoogle Scholar
Kirchartz, T., Helbig, A., Reetz, W., Reuter, M., Werner, J. H., and Rau, U., Progr. Photov.: Res. Appl. 17, 394 (2009).CrossRefGoogle Scholar
Kirchartz, T. and Rau, U., J. Appl. Phys. 102, 104510 (2007).CrossRefGoogle Scholar
Vandeval, K., Tsvingsted, K., Gadisa, A., Inganas, O., and Manca, J. V., Nature Materials 8, 904 (2009).CrossRefGoogle Scholar
Kirchartz, T., Rau, U., Hermle, M., Bett, A. W., Helbig, A., and Werner, J. H., Appl. Phys. Lett. 92, 123502 (2008).CrossRefGoogle Scholar
Roensch, S., Hoheisel, R., Dimroth, F., and Bett, A. W., Appl. Phys. Lett. 98, 251113 (2011).CrossRefGoogle Scholar
Kirchartz, T. and Rau, U., Physica Status Solidi A 205, 2737 (2008).CrossRefGoogle Scholar
Pieters, B. E., Merdzhanova, T., Kirchartz, T., and Carius, R., Sol. Ener. Mater. Sol. Cells 94, 1851 (2010).CrossRefGoogle Scholar
Müller, T. C. M., Pieters, B. E., Kirchartz, T., Carius, R., Rau, U., Phys. Stat. Sol. C 9, 1963 (2012).Google Scholar
Rau, U. and Schock, H. W., Appl. Phys. A 69, 131 (1999).CrossRefGoogle Scholar
Walter, T., Herberholz, R., and Schock, H. W., Solid State Phenomena 51–52, 309 (1996).CrossRefGoogle Scholar
Rau, U., Jasenek, A., Schock, H. W., Engelhardt, F., and Meyer, T., Thin Solid Films 361–362, 298 (2000).CrossRefGoogle Scholar
Igalson, M. and Schock, H. W., J. Appl. Phys. 80, 5765 (1996).CrossRefGoogle Scholar
Rau, U., Schmitt, M., Parisi, J., Riedl, W., and Karg, F., Appl. Phys. Lett. 73, 223 (1998).CrossRefGoogle Scholar
Zabierowski, P., Rau, U., and Igalson, M., Thin Solid Films 387, 147 (2001).CrossRefGoogle Scholar
Meyer, Th., Engelhardt, F., Parisi, J., and Rau, U., J. Appl. Phys. 91, 5093 (2002).CrossRefGoogle Scholar
Heath, J. T., Cohen, J. D., and Shafarman, W. N., J. Appl. Phys. 95, 1000 (2004).CrossRefGoogle Scholar
Lany, S. and Zunger, A., J. Appl. Phys. 100, 113725 (2006).CrossRefGoogle Scholar
Lany, S. and Zunger, A., Phys. Rev. Lett. 100, 016401 (2008).CrossRefGoogle Scholar
Urbaniak, R. and Igalson, M., J. Appl. Phys. 106, 063720 (2009).CrossRefGoogle Scholar
Siebentritt, S., Igalson, M., Person, C., and Lany, S., Progr. Photov.: Res. Appl. 18, 390 (2010).CrossRefGoogle Scholar
Kniese, R., Powalla, M., and Rau, U., Thin Solid Films 515, 6163 (2007).CrossRefGoogle Scholar
Dimmler, B., Powalla, M., and Schaeffler, R., in: Proceedings of the 31st IEEE Photovoltaic Specialists Conference (IEEE, New York, 2005) pp. 189–194.Google Scholar
Tran, T. M. H., Pieters, B. E., Ulbrich, C., Gerber, A., Kirchartz, T., and Rau, U., Thin Solid Films (2012, published online, http://dx.doi.org/10.1016/j.tsf.2012.10.039).Google Scholar