Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T01:40:36.005Z Has data issue: false hasContentIssue false
  • English
  • Français

Electrodeposited Metallic Nanowires as a Scanning Probe Tip

Published online by Cambridge University Press:  31 January 2011

Munekazu Motoyama  and
Fritz B. Prinz
Munekazu Motoyama
Affiliation:
[email protected], Stanford University, Mechanical Engineering, Stanford, California, United States
Fritz B. Prinz
Affiliation:
[email protected], Stanford University, Mechanical Engineering, Stanford, California, United States
Get access

Abstract

This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.

Keywords

scanning probe microscopy (SPM)electrodepositionnanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1206: Symposium M – Multifunction at the Nanoscale through Nanowires , 2009 , 1206-M18-03
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

11. Whitney, T. M., Jiang, J. S., Searson, P. C., Chien, C. L., Science, 261, 1316 (1993).Google Scholar
2 Hu, J., Odom, T. W., Lieber, C. M., Acc. Chem. Res., 32, 435 (1999).Google Scholar
3 Dai, H., Hafner, J. H., Rinzler, A. G., Colbert, D. T., Smalley, R. E., Nature, 384, 147 (1996).Google Scholar
4 Dai, H., Wong, E. W., Lieber, C. M., Science, 272, 523 (1996).Google Scholar
5 Motoyama, M., Dagupta, N. P., and Prinz, F. B., J. Electrochem. Soc., 156, D431 (2009).Google Scholar
6 Bai, S.-J., Fabian, T., Prinz, F. B., Fasching, R. J., Sens. Actuators B, 139, 249 (2008).Google Scholar
7 Wong, E. W., Sheehan, P. E., Lieber, C. M., Science, 277, 1971 (1997).Google Scholar
8 Wu, B., Heidelberg, A., Boland, J. J., Nat. Mater., 4, 525 (2005).Google Scholar
9 Song, J., Wang, X., Riedo, E., Wang, Z. L., Nano Lett., 5, 1954 (2005).Google Scholar
10 Motoyama, M., Fukunaka, Y., Sakka, T., Ogata, Y. H., Kikuchi, S., J. Electroanal. Chem., 584, 84 (2005).Google Scholar
11 Gere, J. M., Mechanics of Materials 6th ed., p. 331, Brooks/Cole-Thomas Learning, Belmont (2004).Google Scholar
12 Sader, J. E., Chon, J. W. M., Mulvaney, P., Rev. Sci. Insrum., 70, 3967 (1999); http://www.ampc.ms.unimelb.edu.au/afm/.Google Scholar
13 Lantz, M. A., O'Shea, S. J., Hoole, A. C. F., Welland, M. E., Appl. Phys. Lett., 80, 970 (1997).Google Scholar
14 Lund, A. C. and Schuh, C. A., Acta Mater., 53, 3193 (2005).Google Scholar
15 Srinivasan, S. G. and Baskes, M. I., Metall. Mater. Trans. A, 38, 2716 (2007).Google Scholar