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Electrical/Dielectric Properties of Nanocrystalline Cerium Oxide

Published online by Cambridge University Press:  10 February 2011

Jin-Ha Hwang
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Dr., Evanston, IL 60208–3108
Thomas O. Mason*
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Dr., Evanston, IL 60208–3108
Edward J. Garboczi
Affiliation:
National Institute of Standards & Technology, Bldg. 226, Rm. B-350, Gaithersburg, MD 20899
*
Author to whom correspondence should be addressed
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Abstract

Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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