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Electrical Properties of Nichia AlGaN/InGaN/GaN Blue LEDs in a Wide Current/Temperature Range

Published online by Cambridge University Press:  21 February 2011

Joachim Zeller
Affiliation:
Center for High Technology Materials, University of New Mexico, Albuquerque, NM 87131-6081
Petr G. Eliseev
Affiliation:
On leave from P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, Russia
Philippe Sartori
Affiliation:
On leave from Ecole Nationale Supérieure des Télécommunications, Paris, France
Piotr Perlin
Affiliation:
On leave from High Pressure Research Center, Warsaw, Poland
Marek Osiński
Affiliation:
Center for High Technology Materials, University of New Mexico, Albuquerque, NM 87131-6081
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Abstract

Studies of electrical characteristics of nitride-based light emitting diodes (LEDs) are of interest as they can shed light on carrier transport across the p-n heterojunction. In addition, they provide a convenient way of investigating degradation processes associated with high electrical stress. We present electrical characteristics of Nichia NLPB500 blue LEDs based on AlGaN/InGaN/GaN material system in the temperature range of 9-340 K. Two components of current are identified. High-density current stress leads to diode degradation by shunt formation caused by metal electromigration. At 8 K, blue emission was observed at currents as small as 20 nA.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1 Nakamura, S., Mukai, T., and Senoh, M., Appl. Phys. Lett. 64 (13), pp. 16871689 (1994); S. Nakamura, J. Cryst. Growth 145, pp. 911–917 (1994); S. Nakamura, J. Vac. Sci. & Technol. A13, 705 (1995).Google Scholar
2 Osiński, M. and Eliseev, P.G., Abstracts, Topical Workshop on ni-V Nitrides, Nagoya, Japan, 2123 Sept. 1995, Paper C-5; P.G. Eliseev, M. Osiński,B. S. Phillips, P.-C. Chiu, G. Mohs, B. Fluegel, H. Giessenb, and N. Peyghambarian, Conf. Proc, LEOS ‘95 8th Annual Meeting, San Francisco, CA, Oct. 30 - Nov. 2, 1995, Paper OMP4.3, Vol. 2, pp. 104–105.Google Scholar
3 Barton, D.L., Zeller, J., Phillips, B.S., Chiu, P.-C., Askar, S., Lee, D.-S., Osiński, M. and Malloy, K. J., 1995 (33rd Annual) IEEE International Reliability Physics Proc., Las Vegas, NV, 4-6 April 1995, pp. 191–199.Google Scholar
4 Molnar, R.J., Lei, T., and Moustakas, T.D., Appl. Phys. Lett. 62 (1), pp. 7274 (1993).Google Scholar
5 Yamasaki, S., Asamu, S., Shibata, N., Koike, M., Manabe, K., Tanaka, T., Amano, H., and Akasaki, I., Appl. Phys. Lett. 66 (9), pp. 11121113 (1995).Google Scholar