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Electrical Properties of Coevaporated CuInS2 Films by in-situ Conductivity Measurements

Published online by Cambridge University Press:  10 February 2011

R. Scheer ,
M. Alt ,
I. Luck ,
R. Schieck  and
H. J. Lewerenz
R. Scheer
Affiliation:
Hahn-Meitner Institute, Department of Physical Chemistry, Glienicker Str. 100, 14109 Berlin, Germany
M. Alt
Affiliation:
Hahn-Meitner Institute, Department of Physical Chemistry, Glienicker Str. 100, 14109 Berlin, Germany
I. Luck
Affiliation:
Hahn-Meitner Institute, Department of Physical Chemistry, Glienicker Str. 100, 14109 Berlin, Germany
R. Schieck
Affiliation:
Hahn-Meitner Institute, Department of Physical Chemistry, Glienicker Str. 100, 14109 Berlin, Germany
H. J. Lewerenz
Affiliation:
Hahn-Meitner Institute, Department of Physical Chemistry, Glienicker Str. 100, 14109 Berlin, Germany
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Abstract

The conductivity σ of CuInS2 films grown by coevaporation is investigated by in-situ measurements during the deposition and ex-situ measurements. During the controlled cool-down period of the grown films, σ vs l/T data are obtained for films with Cu-rich and In-rich composition. Furthermore, first experiments on the effect of extrinsic dopants such as P, N, and Na on the conductivity of In-rich films are reported.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 426: Symposium J – Thin Films for Photovoltaic and Related Device , 1996 , 309
Copyright
Copyright © Materials Research Society 1996

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References

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