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Electrical and optical responsivity of thin palladium films during hydrogen exposure

Published online by Cambridge University Press:  01 February 2011

Susan K ,
Kanthi Yalamanchili ,
Ivica N Kostanic ,
Mohammed Nazer ,
Maria Pozo de Fernandez  and
Mary H McCay
Susan K
Affiliation:
[email protected], Florida Institute of Technology, Electrical Engineering, 150 W University Blvd, 352EC, Melbourne, FL, 32901, United States, 321-394-2171
Kanthi Yalamanchili
Affiliation:
[email protected],Florida Institute of Technology,150 W University Blvd,Melbourne,FL,32901,United States,
Ivica N Kostanic
Affiliation:
[email protected], Florida Institute of Technology, 150 W University Blvd, Melbourne, FL, 32901, United States
Mohammed Nazer
Affiliation:
[email protected], Florida Institute of Technology, 150 W University Blvd, Melbourne, FL, 32901, United States
Maria Pozo de Fernandez
Affiliation:
[email protected], Florida Institute of Technology, 150 W University Blvd, Melbourne, FL, 32901, United States
Mary H McCay
Affiliation:
[email protected], Florida Institute of Technology, 150 W University Blvd, Melbourne, FL, 32901, United States
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Abstract

This paper presents a series of measurements documenting changes in electrical and optical properties of thin palladium films. Palladium is deposited on the glass surface through plasma-assisted physical vapor deposition. This process produces highly uniform films with a surface variation of a few nanometers. The thicknesses of studied films range from 15 to 60 nm. The films are exposed to a constant flow of 2% hydrogen and 98% nitrogen mixture. During the exposure, film resistivity and its reflection properties in visible light were monitored. It is observed that the change in the film resistance during the hydrogen exposure depends on the film thickness. In particular, thicker depositions exhibit larger relative changes of the resistance. The reflectivity of the films in the white light changes during the hydrogen exposure as well. However, the change of the film reflectivity is observed to be independent of the deposition thickness. This paper presents observed measurements, their quantitative analysis and briefly discusses the use of findings in development of low-cost, single-use commercial grade hydrogen sensors.

Keywords

thin filmPdsensor
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1098: Symposium HH – The Hydrogen Economy , 2008 , 1098-HH08-04
Copyright
Copyright © Materials Research Society 2008

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